Vibrating Mode Probes
Vibrating Mode Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact) applications. Compatible with most commercially available SPMs/AFMs, ACLA probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Description
Model ID: ACLA-10
ACLA AFM probes are designed for vibrating mode, non-contact, tapping mode, intermittent contact, and/or close contact SPM/AFM applications. The long ACLA cantilever allows larger laser clearance. The reflex side is coated with aluminum for increased laser signal quality.
Tip Specifications
Material: Silicon
Shape: Pyramidal
Height (µm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (nm): 6
Coating: None
Cantilever Specifications
Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 30 nm ± 5 nm
| Parameter | Nominal Value | Minimum Value | Maximum Value |
| Spring Constant (N/m) | 58 | 36 | 90 |
| Frequency (kHz) | 190 | 160 | 225 |
| Length (µm) | 225 | 215 | 235 |
| Width (µm) | 40 | 35 | 45 |
| Thickness (µm) | 7.8 | 7.3 | 8.3 |
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Download: ACLA AFM Probes Datasheet |
