|Sample Sizes:||Up to 1" X 1" X 3/4"|
|Standard Scanning Modes:||Vibrating(Tapping), Non Vibrating (Contact), Phase, LFM|
|Scanners:||50 x 50 x 17 µm, 15 x 15 x 7 µm|
|Video Optical Microscope:||Zoom to 400X, 2 µm resolution|
|Stage and EBox Size:||Compact table top design|
|Download:||TT-2 AFM Product Datasheet PDF|
Table-Top AFM Overview
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM and includes everything required for high-resolution scanning for one low price.
Key Aspects of the TT-2 AFM
Noise floor as low as 80 pm (.08 nm)
Capable of high-resolution scanning of samples such as DNA, nanoparticles, nanotubes and other nanostructures.
Direct-Drive Tip Approach
A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach.
Industry standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. Compatible with older operating systems as well.
The video optical microscope in a TT-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach.
For Nanotechnology Researchers
Capable of high-resolution scanning of samples such as DNA, nanoparticles, nanotubes and other nanostructures. Read More
AFMs are essential for process development and control applications in advanced technology industries. Read More
For Instrument Innovators
Using AFM as a platform to create a new instrument. Read More
Teaching students about AFM construction, operation, and applications...Read More
Example Application - Analysis of Si Atomic Terraces
The vertical resolution of the TT-2 AFM can be demonstrated with an Si test sample that is a misorientation surface from the Siplane ~ 1(deg). The test sample includes two step sizes; the largest terrace of 50 nm can be visualized with the TT-2 AFM video microscope. The sample also includes single atomic steps of .314 nm. Several TT-2 AFM advantages and features are demonstrated by the analysis of the Si sample.
Video microscope image of the cantilever and Si atomic terrace sample. The lines visualized in the video microscope image are the 50 nm terraces on the sample surface. With the AFM, the smaller atomic steps are found on the terraces.
This 4x4 um image of Si silicon shows a Z scale of 1.8 nm. Each of the grey color scales represents a single atomic step of 0.314 nm.
The blue square shows the area in which the surface texture was measured.
A red circle designates a defect. The line profile for the circled defect is illustrated below.
This histogram analysis shows the height of each of the terraces on the sample. A step height of 0.303 nm is measured.
Surface texture parameters for the image are calculated for the region designated with the blue box. The expected value for the surface roughness (Ra) for this sample is 0.06 nm.
A line profile of the defect designated by the red circle in the image is 0.471 nm in height. This defect was visualized in repetitive images of the same surface area.
Additional Applications of the TT-2 AFM
The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for industry, research and education can be found by clicking on any of the links below:
Life Sciences Applications
Process Development and Process Control Applications
TT-2 AFM Videos
An open design is at the core of all products offered by the AFM Workshop. New types of experiments are more readily designed and implemented through the use of LabVIEW software. All the mechanical drawings for the TT-2 AFM are available in the documentation package option. Finally, AFMWorkshop's Customer Forum allows the company to share specialized designs developed for the TT-2 AFM directly with all customers. For specialized applications, other types of scanners such as flexure and tubes can be easily added to the microscope stage.
More Details about the TT-2 AFM
To read more about the TT-2 AFM, return to the top of the page and click on the various tabs detailing the TT-2 AFM components.