Sample Sizes:	Up to 1" X 1" X 3/4"
Standard Scanning Modes:	Vibrating (Tapping), Non-Vibrating (Contact), Phase, LFM, F/D
Scanners:	100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm
Video Optical Microscope:	Zoom to 400X, 2 µm resolution
Stage and EBox Size:	Compact table top design
Download:	TT-2 AFM Product Datasheet PDF 3-D Model of TT-2 AFM PDF

Key Features and Benefits of the TT-2 AFM

Applications

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for industry, research, and education can be found by clicking on any of the links below:
Photonics Applications
Polymer Applications
Nanoparticle Applications
Life Sciences Applications
Process Development and Process Control Applications
Education Applications

TT-2 AFM Videos

A 40 minute recording of a live stream TT-2 AFM demonstration is available here, along with a series of brief, two-minute introductory videos of the TT-2 AFM and its components here.

The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

Features:

• Microprocessor for scan generation through 24-bit DACs
• Low-noise, variable gain high-voltage amplifiers with PID feedback for XY scanning
• Dimensions: Width 6” | Height 10” | Depth 14”
• High-fidelity, low noise Z feedback circuits for accurate probe tracking
• Phase and amplitude detection circuits for vibrating mode AFM
• Industry-standard National Instruments USB data acquisition board
• Internally accessible header for signal input/output
• Eight channels of ADC for monitoring and displaying data with LabVIEW™ software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

Pre-Scan Tab

All of the functions required before making a scan are on the pre-scan tab. This includes selecting the scan mode, visual PLD alignment, frequency scan, and automatic tip approach.

Topo Scan Tab

Images are acquired using the Topo Scan tab. Parameters selected on the scanning tab include the scan size, scan rate, GPID parameters, and the color scale used for displaying images. Included with the scanning tab is an image buffer capability that facilitates rapid zooming in and out.

Modes Tabs

Software control for optional modes such as MFM, EFM, and advanced F/D are found in the modes tabs. The example shown here is of the advanced F/D mode tab. This allows fine control of all the parameters controlling acquisition of force-distance curves, as well as acquisition of F-D curve maps. Mapping of curve sin this way allows the user to locate and visualize regions of the sample with varying properties, such as presence of specific molecules, or mechanical properties.

Image Analysis Software

Included with the TT-2 AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze, and display SPM images.

• Visualization: false color representation with different types of mapping
• Shaded, logarithmic, gradient- and edge-detected, local contrast representation, and Canny lines
• OpenGL 3D data display: false color or material representation
• Easily editable color maps and OpenGL materials
• Basic operations: rotation, flipping, inversion, data arithmetic, crop, and resampling
• Leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
• Value reading, distance, and angle measurement
• Profiles: profile extraction, measuring distances in profile graph, and profile export
• Filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, and checker pattern removal
• General convolution filter with user-defined kernel
• Statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, and facet orientation analysis
• Statistical quantities calculated from area under arbitrary mask
• Row/column statistical quantities plots
• ISO roughness parameter evaluation
• Grains: threshold marking and un-marking, and watershed marking
• Grain statistics: overall and distributions of size, height, area, volume, boundary length, and bounding dimensions
• Integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), and wavelet anisotropy detection
• Fractal dimension analysis
• Data correction: spot remove, outlier marking, scar marking, and several line correction methods (median, modus)
• Removal of data under arbitrary mask using Laplace or fractal interpolation
• Automatic XY plane rotation correction
• Arbitrary polynomial deformation on XY plane
• 1D and 2D FFT filtering
• Fast scan axis drift correction
• Mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, and shrinking
• Simple graph function fitting, critical dimension determination
• Force-distance curve fitting
• Axes scale calibration
• Merging and immersion of images
• Tip modeling, blind estimation, dilation and erosion

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 5 megapixel camera, light source, microscope stand, and Windows software for displaying images.

Probe Holder/Exchange

The TT-2 AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool.

This combination makes changing probes fast and easy on the TT-2 AFM.

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STEP 1
Put probe on exchange tool

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STEP 2
Press down and slide probe into holder

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STEP 3
Release spring

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The TT-2 AFM includes the MOST COMMONLY USED AFM MODES.

They are:

Vibrating (Tapping)

Vibrating mode imaging is the most commonly used mode for measuring topography images with an AFM. In vibrating mode the vibration amplitude of the probe is held constant during a scan. Adjustable parameters include the vibrating frequency, amplitude of vibration, and the amount of dampening of the vibrating probe.

Non-vibrating (Contact)

In non-vibrating mode, commonly called contact mode, the deflection of a cantilever is held constant during scanning. This mode is often used for scanning in liquids and is also used for measuring force-distance curves.

Phase Mode

Phase mode images are measured in vibrating mode and are useful for identifying different areas of hardness on a surface. The technique operates by measuring the phase change caused by differing materials on a surface while scanning.

Lateral Force

Lateral force mode measures the local friction a probe senses as it is scanned across a surface. The friction can be caused by surface texture and differing chemical composition.

Basic Force/Distance

Force-Distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This simple AFM module allows measurements of force-distance curves. It can be upgraded to the Advanced Force-Distance module (see below).

Optional Modes

OPTIONAL MODES that can be purchased with the TT-2 AFM include:

Magnetic Force

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.

Electric Force

Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. “Dynamic” here means that the cantilever is oscillating and does not make contact with the sample. This force arises due to the attraction or repulsion of separated charges.

Advanced F/D

Force-distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: adhesion, stiffness, compliance, viscoelasticity, and surface layer thickness. This advanced AFM module is flexible and enables many types of experiments.

Force Distance Curve Analysis Software

ISFVEM is a fast, intuitive software program for the analysis of a single force distance curve or a grid of curves generated with the AFMWorkshop advanced force distance acquisition software.

Conductive AFM

The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface. This can be highly useful in development of microelectronics.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFM Control software. This software allows the customer to design their own nanolithographic patterns to be written to the sample surface. VI’s are available to customers who want to modify the software and create new capabilities.

Open Liquid Cell

This option includes a special probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-2 probe holder.

Environmental Cell (Closed Liquid Cell)

The environmental cell, or closed cell, is used for scanning samples in liquid or gas environments. Both the sample and probe are enclosed in a chamber that has an entry and exit port for the liquid or gas.

Scanning Kelvin Probe Microscopy (SKPM)

SKPM measures the potential difference between a conductive probe and a conductive sample. The SKPM measurement is made by monitoring the output of a feedback loop that adjusts the potential on a probe so that the potential difference between the probe and surface is zero.

Scanning Tunneling

n the STM, the current flow between a metal probe and a sample is used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample’s surface is measured. This also allows measurement of localized I/V curves.

The TT-2 has several options including advanced packages and accessories for various modes of scanning as well as educational packages.

Required Options

When you purchase a TT-2 AFM you must select at least one scanner from the following table:

Additional TT-2 AFM Options