Atomic Force Microscopes For Thin Films
There are many advantages for using Atomic Force Microscopes to visualize and measure thin films. For example, AFM images provide extreme contrast on thin films with textures from less than 100 picometers to microns. With an AFM you can also measure surface texture and particle size distributions when particles are <5 nm diameter. AFMs also enable you to measure film thickness, and film electrical properties.
For more information on studying thin films using an AFM click here.
Ablated Film – AFM image of a thin film created with laser ablation of silver onto a silver surface. This image is 2 X 2 microns and was measured with vibrating mode AFM.
CrAu on GaAS – This AFM image shows the partial coverage of a thin film of CrAu deposited on a GaAs substrate. The image is 50 X 50 microns and was measured in vibrating mode AFM.
Indium Tin Oxide – Direct visualization of grain structure of a thin indium tin oxide film deposited on a glass substrate. The image is 50 X 50 microns and was measured in vibrating mode
Paint – Phase mode AFM image of a water based paint coating on a smooth substrate. The structure in this image is not topographical, but is a result of regions having different hardness. The image is 2 X 2 microns.
Topography and Phase images of oil based paint
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AFMWorkshop AFM Products for Thin Films
All AFM workshop Atomic Force Microscope products measure images of thin films. However, if the roughness of the surface is < 1 nm we recommend the TT-2 AFM, HR AFM or the HR-2D AFM.
