Model: PS-2010 & H-50

The PS-2010 & H-50 piezoelectric scanner is designed for use with AFMWorkshop’s TT-2 AFM and HR AFM, while the H-50 is designed for the HR-2D AFM. All scanners use temperature compensated strain gauges for linearizing scans in the X- and Y-axis. The PS-2010, PS-2019, H-100 and H-50 have a temperature compensated strain gauge in the Z axis, while the PS-2011 and H-15 do not. All scanners use a modified tripod flexure design for creating motion in the XY-axis. Motion is generated through a lever arm. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauges as well as a 20 pin ribbon cable connector. The TT-2 and HR scanners are attached to the XY manual positioner with three M6 socket head screws.

Download 50 Micron Scanner Datasheet

Sample Holding Stage

Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable

The TT-2 AFM and HR AFM scanners are interchangeable. The HR 2D scanners (H-100,H-50 and H-15) are not interchangeable by customers. Scanners are removed from the TT-2 and HR AFM stage by unscrewing three M6 socket head screws and unplugging a 20 pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with another scanner.

Specifications