Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

Features:

• Microprocessor for scan generation through 24-bit DACs
• Low-noise, variable gain high-voltage amplifiers with PID feedback for XY scanning
• Dimensions: Width 6” | Height 10” | Depth 14”
• High-fidelity, low noise Z feedback circuits for accurate probe tracking
• Phase and amplitude detection circuits for vibrating mode AFM
• Industry-standard National Instruments USB data acquisition board
• Internally accessible header for signal input/output
• Eight channels of ADC for monitoring and displaying data with LabVIEW™ software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the HR AFM to be readily combined with any other instrument using LabVIEW.

Pre-Scan Tab

All of the functions required before making a scan are on the pre-scan tab. This includes selecting the scan mode, visual PLD alignment, frequency scan, and automatic tip approach.

Topo Scan Tab

Images are acquired using the Topo Scan tab. Parameters selected on the scanning tab include the scan size, scan rate, GPID parameters, and the color scale used for displaying images. Included with the scanning tab is an image buffer capability that facilitates rapid zooming in and out.

Modes Tabs

Software control for optional modes such as MFM, EFM, and advanced F/D are found in the modes tabs. The example shown here is of the advanced F/D mode tab. This allows fine control of all the parameters controlling acquisition of force-distance curves, as well as acquisition of F-D curve maps. Mapping of curve sin this way allows the user to locate and visualize regions of the sample with varying properties, such as presence of specific molecules, or mechanical properties.

Image Analysis Software

Included with the HR AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze, and display SPM images.

• Visualization: false color representation with different types of mapping
• Shaded, logarithmic, gradient- and edge-detected, local contrast representation, and Canny lines
• OpenGL 3D data display: false color or material representation
• Easily editable color maps and OpenGL materials
• Basic operations: rotation, flipping, inversion, data arithmetic, crop, and resampling
• Leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
• Value reading, distance, and angle measurement
• Profiles: profile extraction, measuring distances in profile graph, and profile export
• Filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, and checker pattern removal
• General convolution filter with user-defined kernel
• Statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, and facet orientation analysis
• Statistical quantities calculated from area under arbitrary mask
• Row/column statistical quantities plots
• ISO roughness parameter evaluation
• Grains: threshold marking and un-marking, and watershed marking
• Grain statistics: overall and distributions of size, height, area, volume, boundary length, and bounding dimensions
• Integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), and wavelet anisotropy detection
• Fractal dimension analysis
• Data correction: spot remove, outlier marking, scar marking, and several line correction methods (median, modus)
• Removal of data under arbitrary mask using Laplace or fractal interpolation
• Automatic XY plane rotation correction
• Arbitrary polynomial deformation on XY plane
• 1D and 2D FFT filtering
• Fast scan axis drift correction
• Mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, and shrinking
• Simple graph function fitting, critical dimension determination
• Force-distance curve fitting
• Axes scale calibration
• Merging and immersion of images
• Tip modeling, blind estimation, dilation and erosion

The HR AFM includes 2 video optical microscopes for viewing the sample and probe. The video microscopes are essential for locating features on a surface, making a safe and efficient probe approach, and aligning the light lever force sensor.

Top View Video Microscope

From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. The with a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning.

Side View Video Microscope

A side view video microscope, has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don't reflect light.

Probe Holder/Exchange

The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool.

This combination makes changing probes fast and easy on the HR AFM.

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STEP 1
Put probe on exchange tool

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STEP 2
Press down and slide probe into holder

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STEP 3
Release spring

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The true measure of an AFM is the quality of images it measures. With a noise floor of less than 35 picometers, and 28 bit scanning resolution, the HR AFM is capable of measuring the highest resolution images on many types of samples including: polymers, 2-D samples, crystals, ceramics, bio molecules, biomaterials, and semiconductors.

• 2 X 2 microns

  2x2 microns of F10H20 from the HR AFM gallery

• 500 X 500 nm

  Cropped 2x2 microns of F10H20 from the HR AFM gallery

• 250 X 250 nm

  Cropped and zoomed 2x2 microns of F10H20 from the HR AFM gallery

2 X 2 microns

500 X 500 nm

250 X 250 nm

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• Vibrating mode images of collagen fibrils; 3µm × 3µm × 19.8 nm

  Collagen fibrils taken in vibrating mode from the HR AFM gallery
• 4 X 4 nm image of Teflon; Courtesy of Grapes Technology
  4 X 4 nm image of Teflon

• Graphene on crystalline nickel surface

  Graphene on a crystalline surface from the HR AFM gallery

• 12 × 12 micron scan of a polymer blend

  12x12 micron scan of polymer blend from the HR AFM gallery

• 8 × 8 µm image of polymeric nanocapsules

  Polymeric nanocapsules from the HR AFM gallery

• Indium Tin Oxide electrode surface; 1.3 µm × 1.3 × µm × 21 nm

  Indium tin oxide electrode surface from the HR AFM gallery

• Individual dsDNA molecule; 250 × 250 × 1.2 nm scan

  Individual dsDNS molecules with 50nm scale from the HR AFM gallery

• Highly linear scan of silicon reference sample

  Linear scan of a silicon reference sample from the HR AFM gallery
• 1 X 1 u image of cylic DNA with bound protein; Courtesy of Justin Peters; University of North Iowa
  1 X 1 u image of cylic DNA with bound protein

• Network of DNA molecules, 1 µm × 1µm × 3.5 nm micron scan

  Network of DNA molecules at a 200nm scale from the HR AFM gallery
• 50 X 50 micron image of WSe2 triangle; Courtesy of Masoud Mahjouri Saman, Auburn University
  50 X 50 micron image of WSe2 triangle
• 4 X 4 micron image of Graphene on Si
  4 X 4 micron image of Graphene on Si

Vibrating mode images of collagen fibrils; 3µm × 3µm × 19.8 nm

4 X 4 nm image of Teflon; Courtesy of Grapes Technology

Graphene on crystalline nickel surface

12 × 12 micron scan of a polymer blend

8 × 8 µm image of polymeric nanocapsules

Indium Tin Oxide electrode surface; 1.3 µm × 1.3 × µm × 21 nm

Individual dsDNA molecule; 250 × 250 × 1.2 nm scan

Highly linear scan of silicon reference sample

1 X 1 u image of cylic DNA with bound protein; Courtesy of Justin Peters; University of North Iowa

Network of DNA molecules, 1 µm × 1µm × 3.5 nm micron scan

50 X 50 micron image of WSe2 triangle; Courtesy of Masoud Mahjouri Saman, Auburn University

4 X 4 micron image of Graphene on Si

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The HR AFM includes the MOST COMMONLY USED AFM MODES.

They are:

Vibrating (Tapping)

Vibrating mode imaging is the most commonly used mode for measuring topography images with an AFM. In vibrating mode the vibration amplitude of the probe is held constant during a scan. Adjustable parameters include the vibrating frequency, amplitude of vibration, and the amount of dampening of the vibrating probe.

Non-vibrating (Contact)

In non-vibrating mode, commonly called contact mode, the deflection of a cantilever is held constant during scanning. This mode is often used for scanning in liquids and is also used for measuring force-distance curves.

Phase Mode

Phase mode images are measured in vibrating mode and are useful for identifying different areas of hardness on a surface. The technique operates by measuring the phase change caused by differing materials on a surface while scanning.

Lateral Force

Lateral force mode measures the local friction a probe senses as it is scanned across a surface. The friction can be caused by surface texture and differing chemical composition.

Basic Force/Distance

Force-Distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This simple AFM module allows measurements of force-distance curves. It can be upgraded to the Advanced Force-Distance module (see below).

Optional Modes

OPTIONAL MODES that can be purchased with the HR AFM include:

Magnetic Force

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.

Electric Force

Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. “Dynamic” here means that the cantilever is oscillating and does not make contact with the sample. This force arises due to the attraction or repulsion of separated charges.

Advanced F/D

Force-distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: adhesion, stiffness, compliance, viscoelasticity, and surface layer thickness. This advanced AFM module is flexible and enables many types of experiments.

Force Distance Curve Analysis Software

ISFVEM is a fast, intuitive software program for the analysis of a single force distance curve or a grid of curves generated with the AFMWorkshop advanced force distance acquisition software.

Conductive AFM

The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface. This can be highly useful in development of microelectronics.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFM Control software. This software allows the customer to design their own nanolithographic patterns to be written to the sample surface. VI’s are available to customers who want to modify the software and create new capabilities.

Open Liquid Cell

This option includes a special probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-2 probe holder.

Scanning Kelvin Probe Microscopy (SKPM)

SKPM measures the potential difference between a conductive probe and a conductive sample. The SKPM measurement is made by monitoring the output of a feedback loop that adjusts the potential on a probe so that the potential difference between the probe and surface is zero.

Scanning Tunneling

n the STM, the current flow between a metal probe and a sample is used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample’s surface is measured. This also allows measurement of localized I/V curves.

Required Options

When you purchase a HR AFM you must select at least one scanner from the following table:

The HR AFM direct drive option utilizes four independent stepper motors for two functions. Read More...

Options