Atomic Force Microscope Manufacturer

Name: NP AFM Nano-Profiling Atomic Force Microscope for Research Application
Brand: AFMWorkshop
Price: 102721.00 USD
Availability: InStock

NP AFM

Nano-Profiling AFM
For process control and development

The NP AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP AFM include process development and process control of technical samples.

Price Range*

$47,485.00 --

$102,721.00

* Prices vary depending on options purchased, importation taxes, and installation - training fees.

Click to Submit Inquiries or Questions

Description

NP-AFM Details

Overview

Stage

EBOX

Software

Video Microscope

Probe Holder

Gallery

Modes

Options

Specifications

High Resolution Video Microscope	Readily locate Features for Scanning
Multiple Sample Stage or Vacuum Chuck	Optimized for specific technical samples
Closed Loop XY scanner	Great accuracy with rapid zoom to feature
Probe Exchange Tool	Reduce time for probe exchange
In plane flexure XY scanner	Minimal out of plane motion in images
Labview software with USB communication	Readily adaptable to new operating systems
Uses Industry standard probes	Probes for specific measurements are readily available.
Includes Vibrating, Non-Vibrating modes	Turnkey system
Pricing	From $41,775.00* *Plus purchase of selected Z Scanner: Z scanner 7µm -or- Z scanner with strain gauge 16µm
Download:	NP AFM Product Datasheet PDF NP AFM-4022 3D NP AFM-4012 3D

Nano-Profiler AFM Overview

The NP AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP AFM system, and several stage options are available for many types of samples. The Nano-Profiler AFM is primarily used for routine scanning of technical samples such as wafers and disks or for nanotechnology research.

Key Features of the NP AFM

Nano-Profiling AFM	The NP AFM accommodates industry-standard sized probes and is used for profiling technical samples including wafers and disks in industry applications.
Standard Operating Modes	Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
Three Sample Stage Options	Three sample stage options can accommodate different samples with sizes as large as 200mm X 200mm X 20mm.
Linearized X, Y Piezoelectric Scanner	Piezoelectric X and Y scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Direct-Drive Tip Approach	A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach.
LabVIEW Operation	Industry standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. Compatible with older operating systems as well.
Video Microscope	The video optical microscope in a NP-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach.

NP AFM Capabilities

Visualization of Surface Features	Visualization of surface features can help understand why a process is working or not working. AFM offers extreme contrast on flat samples often encountered in industry wafers and disks for quality control and assurance.
Surface Roughness/Texture	Surface roughness measurements at the nanoscale are only possible with an atomic force microscope. With the appropriate vibration isolation enclosure, it is possible to measure surface textures under 0.1 nm.
Step-Height Measurements	The NP AFM is a stylus profiler capable of making step height measurements from 0.3 to 500 nanometers. An included video microscope is essential for locating regions of interest for scanning.

The NP AFM stage has excellent thermal and mechanical stability required for high resolution AFM profiling. Additionally, its open design facilitates user modification.

High Resolution Z Stage

The direct drive’s Z stage controls motion down to 330 nm, assuring optimal tip approach. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

Sample Stage

The NP AFM has multiple stage options, including a 2x3 inch manual stage with a resolution of 2 µm, and a sample stage for wafers and discs.

Light Lever Force Sensor

An industry standard light lever force sensor is utilized in the NP AFM. Most commercially available AFM probes are accommodated in the probe holder. The light lever force sensor can make measurements in standard modes, including vibrating, non-vibrating, lateral force, and phase mode.

Video Microscope

The high resolution video microscope has a zoom tube which allows a field of view between 2 X 2 mm and .3 X .3 mm. The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

XY Piezo Scanner

For XY scanning, linearized piezo electric ceramics utilize real-time feedback control to assure accurate measurements. The multiple modified tripod design (MMTD) of the xy scanner provides scans with minimal background bow.

Probe holder

A modular probe holder is used in the light lever force sensor and held in place with a spring clip. Probes can be replaced in less than two minutes with the NP AFM’s probe exchange tool.

NanoProfiling AFM vacuum stage

NP AFM-4012 Stage

The NP AFM-4012 Stage is designed to accommodate many sample shapes and sizes. The stage comes with a holder for 6 standard AFM magnetic disks. Custom sized sample holders may be readily designed and added to the stage.

Atomic force microscope stage for wide variety of sample sizes and shapes

NP AFM-4022 Stage

Wafers and discs up to 8” in diameter are accommodated by the NP AFM-4022 stage. The vacuum chuck has a unique design that holds the samples firmly while also enabling quick adjustments to accommodate varying diameters of sample sizes. There is a “two-tiered” translation system to locate features for AFM imaging.

NanoProfiling AFM vacuum stage

Screws with o-ring seals are provided and allow selection of the correct vacuum chuck diameter.

Electronics in the NP AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

28-Bit Scanning:	With 28-bit scanning, the highest resolution AFM images may be measured. Feedback control using the XY strain gauges assures accurate tracking of the probe over the surface.
Phase and Amplitude Detector Circuit:	Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can display phase data while using amplitude for feedback when scanning in vibrating mode.
Signal Accessible:	At the rear of the EBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.
Status Lights:	At the front of the EBox is a light panel that has seven lights. In the unlikely event of a circuit failure, these lights enable determination of Ebox power supply status.
Precision Analog Feedback:	Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.
Variable Gain High Voltage Piezo Drivers:	An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.

Features:

Microprocessor for scan generation through 24-bit DACs
Low-noise, variable gain high-voltage amplifiers with PID feedback for XY scanning
Dimensions: Width 6” | Height 10” | Depth 14”
High-fidelity, low noise Z feedback circuits for accurate probe tracking
Phase and amplitude detection circuits for vibrating mode AFM
Industry-standard National Instruments USB data acquisition board
Internally accessible header for signal input/output
Eight channels of ADC for monitoring and displaying data with LabVIEW™ software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the NP AFM to be readily combined with any other instrument using LabVIEW.

Pre-Scan Tab

All of the functions required before making a scan are on the pre-scan tab. This includes selecting the scan mode, visual PLD alignment, frequency scan, and automatic tip approach.

Topo Scan Tab

Images are acquired using the Topo Scan tab. Parameters selected on the scanning tab include the scan size, scan rate, GPID parameters, and the color scale used for displaying images. Included with the scanning tab is an image buffer capability that facilitates rapid zooming in and out.

Modes Tabs

Software control for optional modes such as MFM, EFM, and advanced F/D are found in the modes tabs. The example shown here is of the advanced F/D mode tab. This allows fine control of all the parameters controlling acquisition of force-distance curves, as well as acquisition of F-D curve maps. Mapping of curve sin this way allows the user to locate and visualize regions of the sample with varying properties, such as presence of specific molecules, or mechanical properties.

Image Analysis Software

Included with the NP AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze, and display SPM images.

Image Analysis Software

Visualization: false color representation with different types of mapping
Shaded, logarithmic, gradient- and edge-detected, local contrast representation, and Canny lines
OpenGL 3D data display: false color or material representation
Easily editable color maps and OpenGL materials
Basic operations: rotation, flipping, inversion, data arithmetic, crop, and resampling
Leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
Value reading, distance, and angle measurement
Profiles: profile extraction, measuring distances in profile graph, and profile export
Filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, and checker pattern removal
General convolution filter with user-defined kernel
Statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, and facet orientation analysis
Statistical quantities calculated from area under arbitrary mask
Row/column statistical quantities plots
ISO roughness parameter evaluation
Grains: threshold marking and un-marking, and watershed marking
Grain statistics: overall and distributions of size, height, area, volume, boundary length, and bounding dimensions
Integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), and wavelet anisotropy detection
Fractal dimension analysis
Data correction: spot remove, outlier marking, scar marking, and several line correction methods (median, modus)
Removal of data under arbitrary mask using Laplace or fractal interpolation
Automatic XY plane rotation correction
Arbitrary polynomial deformation on XY plane
1D and 2D FFT filtering
Fast scan axis drift correction
Mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, and shrinking
Simple graph function fitting, critical dimension determination
Force-distance curve fitting
Axes scale calibration
Merging and immersion of images
Tip modeling, blind estimation, dilation and erosion

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The NP AFM includes a high performance video optical microscope along with a 3 camera, light source, microscope stand, and Windows software for displaying images.

TT AFM Video Optical Microscope shows test structure Here the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

NP AFM Video Microscope on HOPG The video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

NP AFM Introduction from AFMWorkshop on Vimeo.

PROBE HOLDER/EXCHANGE

The NP AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool.

This combination makes changing probes fast and easy on the NP AFM.

STEP 1
Pull the probe clip back, place the probe on the probe holder

STEP 2
Lift the clip up and move it forward over the probe chip

Step 3 - Drop the probe clip onto the probe clip

STEP 3
Drop the probe chip onto the probe clip

Patterned Wafer Analysis

An atomic force microscope is a very high resolution stylus profiler capable of making several types of measurements on processed wafers. The following is an example of measurements on a patterned wafer that was polished by CMP.

Below is a video microscope image of a the region where the three measurements are made. Also visible in the video microscope image is the cantilever; the red is from the laser used in the AFM force sensor. The regions where measurements are made are identified as 1, 2 and 3 in the video microscope image.

video microscope image of patterned wafer and AFM cantilever

Region 1 - Visualization

Scanning on the square identified as region 1 results in the AFM image illustrated below. At random locations in the image there are pockmarks, not visible in the video microscope image. By zooming in with the AFM, we can see in the right image that the pockmarks have debris at their edges. The width of the pockmarks is about 90 nm and the depth is 10nm.

AFM scan revealing pockmarks, .5 µm x .5 µm

Region 2 - Surface Texture

Scans of region 2 do not show noticeable surface structure, as was observed in region 1. A 3-D color scale image of region 2 is shown below. The surface roughness (Sa) of this region is 1.69 nm which is 10 times greater than the noise floor of the AFM used for generating this image.

10 µm x 10 µm AFM scan showing surface roughness of patterned wafer

Parameters
Average value:	15.43 nm
Minimum:	7.12 nm
Maximum:	29.85 nm
Median:	15.39 nm
Ra (Sa):	1.69 nm
Rms (Sq):	2.11 nm
Skew:	0.135
Kurtosis:	0.05
Surface area:	100.166 μm²
Projected area:	100.000 μm²
Inclination θ:	0.0 deg
Inclination φ:	-71.8 deg

Region 3 - Step Height Measurements

Region 3 is a series of lines that are about 1 µm wide, and are visible in the video optical microscope. An AFM image of these lines is illustrated below. Using a histogram of the AFM image the height of the lines is readily measured to be 43 nm.

Atomic force microscope scan of patterned wafer 1 µm lines and histogram for height of 43 nm

Interesting Images

40 X 40 micron, 3-D display of an ink drop place on the conductive trace.

12 X 12 micron 2-D view of a grating pattern with a 0.5 micron pitch.

5 X 5 micron 3-D display a pattern stamped into a polymer sample.

2 X 2 micron 3-D display of the a pattern stamped in a polymer sample. The spacing between feature is 0.25 microns.

Hologram Metrology

Left: Color scale image of a hologram pattern.

Top: Line profile showing the height of the features in the hologram are 2.8 microns.

Left: Color scale image of a hologram pattern.

Top: Line profile showing the height of the features in the hologram are 2.8 microns.

Grating Metrology

Left: 1 X 1 micron scan of a holographic grating.

Top: Line profile of the holographic grating. The pitch is .271 microns and the height is 57 nm.

Left: 2 X 1 micron scan of a grating.

Top: Line profile of the grating. The pitch is .5 microns and the height is 117 nm.

The NP AFM includes the MOST COMMONLY USED AFM MODES.

They are:

Vibrating (Tapping)

Vibrating mode imaging is the most commonly used mode for measuring topography images with an AFM. In vibrating mode the vibration amplitude of the probe is held constant during a scan. Adjustable parameters include the vibrating frequency, amplitude of vibration, and the amount of dampening of the vibrating probe.

Non-vibrating (Contact)

In non-vibrating mode, commonly called contact mode, the deflection of a cantilever is held constant during scanning. This mode is often used for scanning in liquids and is also used for measuring force-distance curves.

Phase Mode

Phase mode images are measured in vibrating mode and are useful for identifying different areas of hardness on a surface. The technique operates by measuring the phase change caused by differing materials on a surface while scanning.

Lateral Force

Lateral force mode measures the local friction a probe senses as it is scanned across a surface. The friction can be caused by surface texture and differing chemical composition.

Basic Force/Distance

Force-Distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This simple AFM module allows measurements of force-distance curves. It can be upgraded to the Advanced Force-Distance module (see below).

Optional Modes

OPTIONAL MODES that can be purchased with the NP AFM include:

Magnetic Force

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.

Electric Force

Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. “Dynamic” here means that the cantilever is oscillating and does not make contact with the sample. This force arises due to the attraction or repulsion of separated charges.

Advanced F/D

Force-distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: adhesion, stiffness, compliance, viscoelasticity, and surface layer thickness. This advanced AFM module is flexible and enables many types of experiments.

Force Distance Curve Analysis Software

ISFVEM is a fast, intuitive software program for the analysis of a single force distance curve or a grid of curves generated with the AFMWorkshop advanced force distance acquisition software.

Conductive AFM

The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface. This can be highly useful in development of microelectronics.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFM Control software. This software allows the customer to design their own nanolithographic patterns to be written to the sample surface. VI’s are available to customers who want to modify the software and create new capabilities.

Open Liquid Cell

This option includes a special probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-2 probe holder.

Scanning Kelvin Probe Microscopy (SKPM)

SKPM measures the potential difference between a conductive probe and a conductive sample. The SKPM measurement is made by monitoring the output of a feedback loop that adjusts the potential on a probe so that the potential difference between the probe and surface is zero.

Scanning Tunneling

n the STM, the current flow between a metal probe and a sample is used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample’s surface is measured. This also allows measurement of localized I/V curves.

Scanning Kelvin Probe (SKPM)	SKPM measures the potential difference between a conductive probe and a conductive sample. Learn More
Electric Force Microscopy EFM)	Using two pass scanning, the electric charge at a surface is imaged. Learn More
Scanning Tunneling (STM)	The current flow between the probe and sample is used to control the feedback loop in the microscope when scanning electrically conductive samples. Learn More
Dunk and Scan - Open Liquid Cell	Open liquid cell for scanning samples submerged in liquids. Can directly replace the TT-2 AFM probe holder of the NP, SA, or LS-AFM probe holder. Learn More
Lithography	Uses an AFM probe to alter the physical or chemical property of a sample surface. Learn More
Advanced Force/Distance	Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters such as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Learn More
Magnetic Force	Measures the surface magnetic field of a sample by incorporating a magnetic probe into the AFM. Learn More
Vacuum Box	A compact, self-contained vacuum system designed to securely hold wafers, discs, and other flat samples on a vacuum chuck. Learn More
Force Distance Curve Analysis Software	Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Learn More
Image Logger	This option allows display of six channels in the forward and reverse direction. It has a spectrum function as well as a six channel data logger. Learn More
Break Out Box	BNC gives access to most of the signals in the Ebox. Learn More
Scanner: Tip Scanning Z with Strain Gauge 17µm	Piezoelectric ceramic holder offering 17 micron Z-axis displacement closed-loop feedback control. Learn More
Scanner: Tip Scanning Z 7µm	High-resolution 7 micron vertical scanning module optimizing z-axis position consistency. Learn More
Q-Box/Q-Base	The Q-Box is a unique vibration solution that reduces both sound and structural vibrations. Learn More

50 MICRON XY SCANNER

Type	Modified Tripod
xy Linearity	< 1%
xy Range	> 50 μm
xy Resolution	< 3 nm closed loop < 0.3 nm open loop
xy Actuator type	Piezo
xy Sensor type	Strain Gauge

17 MICRON Z SCANNER / PROBE HOLDER

Noise	< 0.2 nm
Strain Gauge Resolution	1 nm
Tip Angle	10°
Z Linearity	< 5%
Z Linearity-Sensor	< 1%

7 MICRON Z SCANNER / PROBE HOLDER

Noise	< 0.12 nm
Strain Gauge Resolution	na
Tip Angle	10°
Z Linearity	< 5%

LIGHT LEVER AFM FORCE SENSOR

Probe Types

Industry-standard

Probe Insertion

Manual

Probe Exchange

Tool

Probe Holding Mechanism

Clip
Vibrating Mode Piezo
Electrical Connector
to Probe

Laser/Detector Adjustment Range

+/- 1.5 mm

Adjustment Resolution

1 μm

Minimum Probe to Objective

25 mm

Laser Type

670 nm Diode, < 3 mW

Laser Focus

< 25 μm

Detector

Type	4 Quadrant
Band Width	> 500 kHz
Signals Transmitted	TL, BL, TR, BR
Gain	Low, High Settings

Probe sample angle

10°

SOFTWARE

Environment

LabVIEW™

Operating System

Windows

Image Acquisition

Real Time Display
(2 of 8 channels)

Control Parameters

PID	Yes
Setpoint	Yes
Range	Yes
Scan Rate	Yes
Image Rotate	0° and 90°

Laser Align

Yes

Vibrating Freq. Display

Yes

Force Distance

Yes

Tip Approach

Yes

Oscilloscope

Yes

Image Store Format

Industry-standard

Image Pixels

16 x 16 to 1024 x 1024

H.V. Gain Control

XY and Z

Real Time Display

Line Level,
Light Shaded,
Grey Color Palette

Calibration

System Window

Probe Center

Yes

DIGITAL DATA INPUT OUTPUT

Connection

USB

Scanning

DAC

Number	2
Bits	24
Frequency	7 kHz

Control DAC

Number	2
Bits	14
Frequency	2 kHz

ADC

Number	8
Bits	14
Frequency	48 kHz

Z MOTION

Type	Direct Drive
Range	25 mm
Drive Type	Stepper Motor
Min. Step Size	3330 nm
Slew Rate	8 mm/minute
Limit Switch	Top, Bottom
Control	Software – Rate, Step Size

ANALOG ELECTRONICS

Vibrating Mode

Freq Range	2 kHz – 800 kHz
Output Voltage	10 Vpp
Demod. Freq	TBD

Z Feedback

Type	PID
Bandwidth	> 3 kHz
Sample Hold	Yes
Voltage	0 – 150 V

XY Scan

Voltage	0 – 150 V
Bandwidth	> 200 Hz
Pan & Zoom	22 Bits

Tip Approach Cutoff

< 20 μm sec.

VIDEO MICROSCOPE SPECIFICATION

	Minimum Zoom	Maximum Zoom
Field of View	2 x 2 mm	300 × 300 µm
Resolution	20 µm	2 µm
Working Distance	114 mm	114 mm
Magnification	45 ×	400 ×

NP-AFM-4012

Overall XY Range	2” x 3” (5 mm x 7.6 mm)
Resolution	3 μm
Max. Sample Size	6” x 6” x 1/2” (150 mm x 150 mm x 12 mm)

NP-AFM-4022

8” (200 mm) Diameter Vacuum Chuck
Linear Range	4” (100 mm)
Rotational Range	360°
Secondary Manual	XY – 1/4” (6 mm)
Vacuum	Required

SAMPLE HOLDER

Type	Vacuum Chuck
Max. Lateral Dimensions	200 mm
Max. Height	25 mm
Rotational Range	360°

* Z Noise performance depends greatly on the environment the NP-AFM is used in. Best Z noise performance is obtained in a vibration free environment.

** Every effort is made to present accurate specifications, however, due to circumstances beyond AFMWorkshop’s control, specifications are subject to change.

NP AFM Product Datasheet PDF PDF icon

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AFMWorkshop stands behind its products. We offer a two year return to factory warranty with every AFM we offer.

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Atomic Force Microscope Manufacturer

NP AFM

NP-AFM Details

Nano-Profiler AFM Overview

Key Features of the NP AFM

NP AFM Capabilities

High Resolution Z Stage

Sample Stage

Light Lever Force Sensor

Video Microscope

XY Piezo Scanner

Probe holder

NP AFM-4012 Stage

NP AFM-4022 Stage

Features:

Pre-Scan Tab

Topo Scan Tab

Modes Tabs

Image Analysis Software

PROBE HOLDER/EXCHANGE

STEP 1 Pull the probe clip back, place the probe on the probe holder

STEP 2 Lift the clip up and move it forward over the probe chip

STEP 3 Drop the probe chip onto the probe clip

Patterned Wafer Analysis

Region 1 - Visualization

Region 2 - Surface Texture

Region 3 - Step Height Measurements

Interesting Images

Hologram Metrology

Grating Metrology

Vibrating (Tapping)

Non-vibrating (Contact)

Phase Mode

Lateral Force

Basic Force/Distance

Optional Modes

Magnetic Force

Electric Force

Advanced F/D

Force Distance Curve Analysis Software

Conductive AFM

Lithography

Open Liquid Cell

Scanning Kelvin Probe Microscopy (SKPM)

Scanning Tunneling

50 MICRON XY SCANNER

17 MICRON Z SCANNER / PROBE HOLDER

7 MICRON Z SCANNER / PROBE HOLDER

LIGHT LEVER AFM FORCE SENSOR

SOFTWARE

DIGITAL DATA INPUT OUTPUT

Z MOTION

ANALOG ELECTRONICS

VIDEO MICROSCOPE SPECIFICATION

NP-AFM-4012

NP-AFM-4022

SAMPLE HOLDER

Our Guarantee

Our Warranty

Our Lists

Open Architecture

EXPLORE

ESSENTIALS

Training & Support

STEP 1
Pull the probe clip back, place the probe on the probe holder

STEP 2
Lift the clip up and move it forward over the probe chip

STEP 3
Drop the probe chip onto the probe clip