Atomic Force Microscopes
Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. These modular AFMs are useful in a variety of Research, Industry and Education. Applications include nanotechnology, life sciences and biology, process development and control, polymer characterization, and other areas of science and engineering. With high resolution as low as 0.08 nanometers, these atomic force microscopes offer the highest performance to price ratio in the industry. Our AFMs are the best for Education and Career Transformation, Biology, Medicine and other Life Sciences, Nano-Profiling, nanoparticles characterization as well as for highly-demanding applications across all nano industry.
All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), as well as force distance. However you can always expand the capability of your nanoscience instrument even more with optional AFM modes based at your specific needs and requirements.