|Sample Sizes:||Up to 1" X 1" X 1/2"|
|Standard Scanning Modes:||Vibrating (Tapping), Non-Vibrating (Contact), Phase, LFM|
|Scanners:||100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm|
|Video Optical Microscope:||Top View: 5MP Camera, FOV 1 X 1 mm, Resolution: 2 micron|
|Stage Size:||7" X 7" X 11"|
Key Features and Benefits of the HR-2D
|Low Noise Floor||With a noise floor of <30 picometers, the HR-2D AFM is capable of measuring samples with features from nano-meters to microns.|
|Kinematic Tip Approach||A stable kinematic design for probe approach is used in the HR-2D AFM. An optional direct drive approach is available.|
|Top View Video Optical Microscope||The top view video microscope feature includes a 5 MP CMOS video camera, a 0.5 " focus adjustment, and a field of view of 1 X 1 mm.|
|Multiple Scanners||Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.|
|LabView Software||The HR-2D AFM uses industry standard lab view software. For customization, the systems VI's are readily available.|
|Modular Design||Once you buy the HR-2D AFM you can add options and modes such as focus assist, image logger, lithography when you are ready.|
|Simple Probe Exchange||With the removable probe holder, exchanging probes is simple, and takes less than a minute.|
|Universal Probe Holder||Because the HR-2D AFM has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.|
- Air sensitive materials
- Low dimensional materials
- 2-D Materials
Atomic Force Microscopes are ideally suited for creating 3-D images and measurements on 2-D materials. This is because AFMs have extreme contrast on flat samples and can magnify surface heights by factors of millions to billions. Standard reference samples that illustrate the extreme contrast of an AFM are SiC and Si (111). Each of these samples has well characterized surface features that are in the same range as 2-D materials such as graphene.
Figure 1a: Three dimensional color scaled image of SiC. The steps on this sample are 750 pico-meters.
Figure 1b: Gray scale image of Si (111) atomic steps. The steps on this sample are 300 pico-meters in height.
Besides illustrating the power of an AFM, these types of samples serve as calibration samples for microscopes used for imaging 2-D materials. (Read more...)