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AFM Probes

Atomic Force Microscope Probes

Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force distance scanning. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

AFMWorkshop offersAFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only.

ACLA AFM/SPM Probe

ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact)...

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SHOCONA AFM/SPM Probe

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially...

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