Non Vibrating Mode Probes
Non Vibrating Mode Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Description
Model ID: SHOCONA-10
SHOCONA AFM Probes are designed for contact mode applications with a shorter length, providing better sensitivity without compromising on spring constant requirements. The reflex side is coated with aluminum for increased laser signal quality.
Tip Specifications
Material: Silicon
Shape: Pyramidal
Height (µm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (nm): 6
Coating: None
Cantilever Specifications
Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 50 nm ± 5 nm
| Parameter | Nominal Value | Minimum Value | Maximum Value |
| Spring Constant (N/m) | 0.14 | 0.01 | 0.60 |
| Frequency (kHz) | 21 | 8 | 37 |
| Length (µm) | 225 | 215 | 235 |
| Width (µm) | 46 | 41 | 51 |
| Thickness (µm) | 1.0 | 0.5 | 1.5 |
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Download: SHOCONA AFM Probe Datasheet PDF |
