|Available with AFMWorkshop inverted microscope||Turnkey system with guaranteed results|
|Glass slides and petri dish sample holder||No additional sample holding options required for most applications|
|Includes liquid scanner||Readily scan samples in ambient air and liquids|
|Closed loop XY scanner||Zoom to feature with accurate positioning for F/D curves|
|LabVIEW software with USB communication||Readily adaptable to new operating systems|
|Probe exchange tool included||Reduce time for probe exchange (& use any manufacturer's probes)|
|Includes top view video microscope||Facilitates tip approach and laser alignment|
|Includes vibrating, non-vibrating, phase, LFM, and advanced F/D||Most common scanning modes included for life sciences applications|
|Download:||LS-AFM Product Datasheet PDF|
The LS-AFM presents three views of e. coli, from video optical microscope, inverted optical microscope, and atomic force microscope
Life Sciences Atomic Force Microscope Overview
The LS-AFM is used in biology applications in conjunction with an inverted optical microscope. Customers can buy the LS-AFM in two variations:
For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer's existing inverted optical microscope.
This configuration of the LS-AFM includes a fully-featured inverted optical microscope.
Features of the LS-AFM include:
- Dry and Liquid Z Scanner
- AFM Adapter Plate for Inverted Microscopes
- Linearized XY Scanner
- Advanced Force Distance Curves
- Glass Slide and Petri Dish Sample Holder
- Precision AFM Alignment System with Lock-Down
- Included Modes: Vibrating, Non-Vibrating, Phase and LFM
- Direct Drive Z Motor
- Compatible With Standard AFM probes
- Intuitive LabVIEW™ Software Interface
- High Resolution Zoom Video Camera
- High Resolution 24 Bit Scanning
- USB EBox Interface
- Available With AFMWorkshop's Inverted Optical Microscope (or Without)
The LS-AFM is designed for the most widely used types of measurements made with an AFM, including measuring F/D curves and imaging cells in a dry and liquid environment.
Measuring Stiffness of Biomaterials
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.
In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
The above screen shot demonstrates Advanced Force Distance Curve software measuring an AFM image.
1. Force-Distance data display region
2. Slider indicates the extension of the Z piezoelectric ceramic
3. Control parameter selection options
4. AFM Image for selecting locations for force-distance measurements
The Force/Distance Curve Measurement Software Interface includes all the features required for making advanced measurements. F/D curves may be made on single or multiple points of a sample surface. Control parameters include extend/contract rate, turn around trigger, and number of measurements per selected region.
Images of cells are readily scanned in both a liquid and dry environment with the LS-AFM. The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally the inverted microscope can be operated in epifluorescence mode.
Imaging cells in combination with an inverted optical microscope
The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally the inverted microscope can be operated in epiflourescence mode.
Neutrophil A Cells
Inverted optical microscope image of neutrophil A cells. The dotted outline is the area scanned with the AFM.
Light Shaded AFM image of the cells visualized in the optical microscope image.
CACO-2 cell structure in the presence of low concentration of quantum dots.
Left: Epifluorescence, showing brightfield (red), DAPI (blue), 2.2nm quantum dot PL emission at 560nm (green).
Right: Topographic AFM image of the indicated area.
AFM Instrument Innovation
As with all AFMWorkshop products, the LS-AFM mechanical design documents, schematics and software source code are available to all customers. This information enables customers to modify the LS-AFM and to create new AFM instrumentation for novel applications.
More Details about the LS-AFM
To read more about the LS-AFM, return to the top of the page and click on the various tabs detailing the LS-AFM and its Stage; EBox; Software; Video Microscope; Probe Holder; Modes; Options; Specifications; and Images. You can also check out this LS-AFM Introduction Video below.