SA-AFM

Standalone AFM

For large samples and industry


The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.

FROM
$41,340.00

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Description

Use the SA-AFM for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is a complete system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated with all manufacturer’s inverted microscopes.

SA-AFM Details

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Overview
Stage
EBOX
Software
Video Microscope
Probe Holder
Gallery
Modes
Options
Specifications
SA-AFM Overview
Open Frame Design Any sized sample can be scanned
Includes bottom plate Allows for scanning small samples
Probe Exchange Tool Included Reduce time for probe exchange
Includes top view video microscope Facilitates tip approach and laser alignment
Includes vibrating, non-vibrating, phase, LFM, and advanced F/D Most common scanning modes included for many applications
Flexible Sample holder Can be used with most commercially available probes
Labview software with USB communication Readily adaptable to new operating systems
Pricing From  $32,350.00*
*Plus selected Z Scanner 
Download: SA-AFM Product Datasheet PDF

 

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-Atomic Force Microscope for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is a complete system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated with all manufacturer's inverted microscopes.

  • Flexible, stand alone design
  • Scans any sample size
  • Adaptable to inverted microscopes
  • Linearized xy piezoelectric scanner
  • Accommodates widest range of standard AFM probes
  • All standard modes, including vibrating, non-vibrating, and phase
  • Direct drive motorized probe approach
  • Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

SA-AFM Measurements

In addition to measuring surface structure, the SA-AFM is ideal for modes measurements. 

For example these images are of a polymer sample.  The image at left is a topography image, and the image at right is the phase image, measuring the relative hardness of the polymer sample.

SA-AFM topography image AFM phase image of polymer sample

 

 

Surface Texture

SA AFM Graphics 1pm

Polished Surface - 30 x 30 x 5 µm

Surface texture on polished and machined surfaces is readily measured with the SA-AFM.

With the SA's flexible stage design, fixtures for holding almost any sample shape can be created.

Once measured, the AFM images can be analyzed and standard surface texture parameters such as Ra are readily calculated.

 

 

Dimensional

SA AFM graphic 2 pm

 Calibration reference - 40 x 40 x 1 µm

 

Atomic force microscopes are capable of accurately measuring the dimensions of semiconductor and other micro-fabricated devices. Because the SA-AFM accommodates commercially available AFM probes, specialized probes for metrology measurements can be used.

 

 

 

Visualization

cells SA AFM PM

Cells - 8 x 8 µm

One of the most powerful capabilities of the SA-AFM is the capability to visualize surface structure. Although not easily quantified, the surface texture of this cell structure is readily visualized.

Features that may be readily visualized with the SA-AFM range in size from a few nm to a few µm.

More Details about the SA-AFM

To read more about the SA-AFM, return to the top of the page and click on the various tabs detailing the SA-AFM and its Stage; Ebox; Software; Video Microscope; Probe Holder; Modes; Options; Specifications; and Images.

SA-AFM Stage

Standalone AFM Stage

High Resolution Z Stage
The direct drive’s Z stage controls motion down to 330 nm, assuring optimal tip approach. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

Light Lever Force Sensor
An industry standard light lever force sensor is utilized in the SA-AFM. The probe holder accommodates the widest range of commercially available AFM probes. The light lever force sensor can make measurements in standard modes, including vibrating, non-vibrating, lateral force, and phase mode.

Video Microscope
The high resolution video microscope has a zoom tube which allows a field of view between 2 X 2 mm and .3 X .3 mm. The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

XY Piezoelectric Scanner
For XY scanning, linearized piezoelectric ceramics utilize real time feedback control to assure accurate measurements. The multiple modified tripod design (MMTD) of the xy scanner provides scans with minimal background bow.

Probe Holder
A modular probe holder is used in the light lever force sensor and held in place with a spring clip. Probes can be replaced in less than two minutes with the probe exchange tool. Additionally, the probe holder spring clip can be used to supply voltages to the AFM probe for techniques such as conductive AFM.

 

SA-AFM Stage

SA AFM Stage


Large objects that will not fit in a traditional stage may be imaged with the SA-AFM. In this example, the monitor of a commercial AFM is being imaged.

 

 

SA-AFM EBOX

SA-AFM EBOX

Electronics in the SA-AFM are constructed around industry standard USB data acquisition electronics. The critical functions, such as xy scanning, are optimized with a 24-bit digital to analog converter. With the analog z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

24-bit Scan DAC
Scanning waveforms for generating precision motion in the X-Y axis with the piezo scanners are created with 24 bit DACS driven by a 32 bit micro controller. With 24 bit scanning, the highest resolution AFM images may be measured. Feedback control using the xy strain gauges assures accurate tracking of the probe over the surface.

Phase and Amplitude Detector Circuit
Phase and amplitude in the Ebox are measured with highly stable phase and amplitude chips. The system can be configured to feed back on either phase or amplitude when scanning in vibrating mode.

Signal Accessible
At the rear of the eBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the eBox.

Precision analog feedback
Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.

Variable Gain High Voltage Piezo Drivers
An improved signal to noise ratio as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.

 

Ebox

 

SA-AFM Software

SA-AFM Software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the SA-AFM to be readily combined with any other instrument using LabVIEW.

Prescan Windows

Pre-scan Window

A pre-scan window includes all of the functions that are required before a scan is started. The functions are presented in a logical sequence on the screen.

 

Scan Window

Scan Window

Once all of the steps in the pre-scan window are completed, the scan window is used for measuring images. Scan parameter, Z feedback parameters, and image view functions may be changed with dialogs on this screen.

 

Force/Distance Curves

Force/Distance Curves

There is a tab for measuring F/D curves in the AFMWorshop software. Data is exported to a .csv file for analysis in standard programs such as Microsoft Excel™.

 

Scan Window

LabVIEW Window

Industry standard programming environment. Readily customized and modified for specialized applications. Instrumentation already using LabVIEW can be added to the SA-AFM to create new capabilities.

 

 

Image Analysis Software

Included with the SA-AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze and display SPM images.

IMAGE ANALYSIS SOFTWARE

 

  • visualization: false color representation with different types of mapping
  • shaded, logarithmic, gradient- and edge-detected, local contrast representation, Canny lines
  • OpenGL 3D data display: false color or material representation
  • easily editable color maps and OpenGL materials
  • basic operations: rotation, flipping, inversion, data arithmetic, crop, resampling
  • leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
  • value reading, distance and angle measurement
  • profiles: profile extraction, measuring distances in profile graph, profile export
  • filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, checker pattern removal
  • general convolution filter with user-defined kernel
  • statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, facet orientation analysis
  • statistical quantities calculated from area under arbitrary mask
  • row/column statistical quantities plots
  • ISO roughness parameter evaluation
  • grains: threshold marking and un-marking, watershed marking
  • grain statistics: overall and distributions of size, height, area, volume, boundary length, bounding dimensions
  • integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), wavelet anisotropy detection
  • fractal dimension analysis
  • data correction: spot remove, outlier marking, scar marking, several line correction methods (median, modus)
  • removal of data under arbitrary mask using Laplace or fractal interpolation
  • automatic xy plane rotation correction
  • arbitrary polynomial deformation on xy plane
  • 1D and 2D FFT filtering
  • fast scan axis drift correction
  • mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, shrinking
  • simple graph function fitting, critical dimension determination
  • force-distance curve fitting
  • axes scale calibration
  • merging and immersion of images
  • tip modeling, blind estimation, dilation and erosion
SA-AFM Video Microscope

SA-AFM Video Microscope

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The SA-AFM includes a high performance video optical microscope along with a 3 mega pixel ccd camera, light source, microscope stand, and Windows software for displaying images.

TT-AFM Video Optical Microscope shows test structureHere the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

TT-AFM Video Microscope on HOPGThe video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

 

TT-AFM laser alignment through video microscope

Laser alignment is greatly facilitated with the video optical microscope. This non-vibrating cantilever is 450 µ long. The red spot is from the laser reflecting off the cantilever.

 

 

 

 

SA-AFM Probe Holder

SA-AFM Probe Holder / Exchange

The SA-AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the SA-AFM.

Probe Holder/Exchange

SA-AFM Image Gallery

AFM Workshop Image Gallery

Marks made with AFM Lithography 20 um x 20 µm

Marks made with AFM Lithography; 20 µm x 20 µm

1 nm and 3 nm particles test sample. 500 nm x 500 nm

1 nm and 3 nm particles test sample. 500 nm x 500 nm AFM image

Nanolithography, 25 µm x 25 µm image

Nanolithography, Changing Probe Force. 25 µm x 25 µm image of lines made in PMMA surface. Each line is 1 µm apart; each has differing probe force.

1 nm and 3 nm particles test sample 100 nm x 100 nm

1 nm and 3 nm particles, test sample. 100 nm x 100 nm

Highly Oriented Pyrolitic Graphite 5 µm x 5 µm

Highly Oriented Pyrolitic Graphite, HOPG 5 µm x 5 µm, showing atomic steps

Latex spheres; 3 µm x 3 µm; 173 nm spheres

Latex spheres; 3 µm x 3 µm; 173 nm latex spheres AFM Image

Ruled Grating Irregularities, 3-D image

Ruled Grating Irregularities, 3-D image, 4 µm x 4 µm

Multiphase Polymer Film, 3D, phase signal overlaid

Multiphase Polymer Film - 3D shape from topography with phase signal overlaid as color

Defects on 0.3 nm Si Terraces, 4 µm x4 µm

AFM image of defects on 0.3 nm Si Terraces, 4 µm x 4 µm

3 µm x 3 µm image of 173 nm latex spheres

Latex spheres; 3 µm x 3 µm image of 173 nm latex spheres

AFM Workshop Image DNA 3um r1 pm

AFM Workshop Image DNA 3um r1 pm

Aluminum foil, 3D image; 50 µm x 50 µm

Aluminum foil, 3D AFM image; 50 µm x 50 µm.

SiC Terraces, 6 µm x 6 µm AFM image

SiC Terraces; 6 µm x 6 µm, AFM image

Aluminum foil, dull side, 3-D image; 50 µm x 50 µm.

Aluminum foil, dull side, 3D image; 50 µm x 50 µm.

Self-assembled lipid nanotubes; 20 µm x 20 µm.

Self-assembled lipid nanotubes; 20 µm x 20 µm, AFM image.

Red blood cells, 30 µm x 30 µm 2D red color scale

Red blood cells, 30 µm x 30 µm 2D red color scale

Self-assembled lipid nanotubes, 5 µm x 5 µm

Self-assembled lipid nanotubes, 5 µm x 5 µm

Red blood cells 3-D AFM image

Red blood cells 3D AFM image

Polymer used in glue, 2D light shaded view

Polymer used in common glue, 10 µm x 10 µm images, 2-D light shaded view

MFM image of magnetic disk; 40 µm x 40 µm

MFM image of magnetic disk; 40 µm x 40 µm

Polymer used in glue 10 µm x 10 µm 3D color scale

Polymer used in common glue 10 µm x 10 µm image, 3-D color scale view

Inverted Optical microscope image of Caco-2 cells

Inverted Optical microscope image of Caco-2 cells; box indicates area selected for AFM scanning

20 µm X 20 µm AFM image of SHS 100 nm test pattern

20 µm X 20 µm AFM image of SHS 100 nm test pattern, color view

AFM scan of Caco-2 cells; 48 µm x 48 µm.

AFM image of Caco-2 cells; 48 µm x 48 µm. AFM scan of area selected by box in previous inverted optical microscope photo

Inverted optical Image of neutraphil a1 cells

Inverted optical image of neutraphil a1 cells, inverted optical microscope view, AFM probe is shadow

Tip checker sample, 2-D color scale

Tip checker sample, 2-D color scale 20 µm x 20 µm image

Neutrophil & erythrocyte cells; 50 µm light shaded

Neutrophil & erythrocyte cells; 50 µm light shaded

Caco-2 cells. Left: Epiflourescence. Right: AFM

Caco-2 cells. Left: Epiflourescence image of Caco-2 cells treated with quantum dots. Right: 50 µm x 50 µm AFM image of Caco-2 cells

Silicon test pattern 40 µm x 40 µm grey scale image

Silicon test pattern 40 µm x 40 µm grey scale image

Holes in polymer film, 10 µm x 10 µm AFM Image

Holes in polymer film, 10 µm x 10 µm AFM Image

Silicon test pattern, 7 µm x 7 µm zoomed in image

Silicon test pattern, 7 µm x 7 µm zoomed in image of particle viewed in the upper center of the left image.

Multiphase polymer height image

Multiphase polymer height image; 10 µm x 10 µm

Patterns on ferroelectric material 50 µm x 50 µm

Patterns on ferroelectric material 50 µm x 50 µm light shaded image.

Multiphase polymer 10 µm x 10 µm, phase image.

Multiphase polymer 10 µm x 10 µm, phase image.

Light shaded image of cell, 7 µm x 7 µm AFM Image

Light shaded image of cell, 7 µm x 7 µm AFM Image

Vibrating mode showing three species of bacteria

Vibrating mode image showing three different species of bacteria

Bacteria, phase mode image

Bacteria, phase mode image 3 µm x 3 µm image of a single bacteria

Amplitude Image of Leishmania 25 µm x 25 µm

Amplitude Image of Leishmania parasites 25 µm x 25 µm

Scratch mark in metal 10 µm x 10 µm color scale

Scratch mark in a metal surface, 10 µm x 10 µm color scale image

Bacteria spore mutants 30 µm x 30 µm AFM image

Bacteria spore mutants 30 µm x 30 µm AFM image

Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image

Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image

Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image

Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image

Tobacco Mosaic Virus 1.2 µm x 1.2 µm color scale

Tobacco Mosaic Virus, 1.2 µm x 1.2 µm color scale image of 17 nm diameter single TMV

Conductive AFM scan, standard reference sample

Conductive AFM scan, standard reference sample, 10 µm x 10 µm conductivity image 

Atomic terraces on metal surface, 5 µm x 5 µm

Atomic terraces on metal surface, 5 µm x 5 µm AFM image

0.3 nm terraces on Si, 5 µm x 5 µm color scale image

0.3 nm terraces on Si, 5 µm x 5 µm color scale image

0.3 nm terraces on Si 10 µm x 10 µm error signal image.

0.3 nm terraces on Si 10 µm x 10 µm error signal image. At the bottom right of this image is a 50 nm step.

Gold nanoparticles 2D color scale 14 nm diameter

Gold nanoparticles, 2D color scale 2 µm x 2 µm image of 14 nm diameter particles

Gold nanoparticles 3D color scale 14 nm diameter

Gold nanoparticles, 3-D color scale 2 µm x 2 µm image of 14 nm diameter particles

Phase mode of PMMA 300 nm x 300 nm

Phase mode image of PMMA 300nm x 300nm AFM image

 HOPG, 4 µm x 4 µm

Highly Oriented Pyrolitic Graphite (HOPG), 4 µm x 4 µm

DNA; 1 µm x 1 µm AFM image

DNA; 1 µm x 1 µm AFM image

DNA; 1.5 µm x 1.5 µm

DNA; 1.5 µm x 1.5 µm

DNA 2 µm x 2 µm, on multiple mica layers

DNA 2 µm x 2 µm, on multiple mica layers

DNA; 1.5 µm x 1.5 µm AFM image

DNA; 1.5 µm x 1.5 µm AFM

DVD: 6 µm x 6 µm AFM image

DVD: 6 µm x 6 µm AFM image

6µm x 6µm AFM scan of graphene

AFM scan, Graphene 6µm x 6µm

2µm x 2µm AFM image, Graphene sample

Graphene sample, AFM image 2µm x 2µm

HOPG 2 µm x 2 µm

Highly Oriented Pyrolitic Graphite, HOPG 2 µm x 2 µm, AFM Image

Small scan of microterraces on previous image

STEPP sample: 3 µm x 3 µm, small scan zoom of microterraces observed on the previous 16 µm x 16 µm image

STEPP: smaller scale zoom to view microterraces

STEPP scan: 3 µm x 3 µm, smaller scale zoom to view microterraces seen on previous 16 µm x 16 µm scan

Epithelial Cell 35 µm x 35 µm, 3D AFM image

Epithelial Cell 35 µm x 35 µm, 3D AFM image

STEPP: 16 µm x 16 µm, showing microterraces

STEPP: 16 µm x 16 µm, showing microterraces on terrace, see features in smaller scans 

Cardiomyocytes; inverted optical miroscope image

Cardiomyocytes; inverted optical miroscope image showing location of AFM probe from below

Polystyrene Nanoparticles: Binodal distribution

Polystyrene Nanoparticles: Binodal distribution of nanoparticles, 20 nm and 100 nm

BOPP polymer film; 2 µm x 2 µm.

BOPP Polymer; 2 µm x 2 µm biaxially oriented polypropylene (BOPP) film.

Calibration reference - 40 µm x 40 µm x 1 µm

Calibration reference - 40 µm x 40 µm x 1 µm

AFM height image of DNA

DNA AFM height image, 2 µm x 2 µm

E. coli cell, displaying fimbriae & polar flagellum

Single E. coli bacterial cell, displaying fimbriae & polar flagellum

Epithelial cell in liquid, 32 µm x 32 µm AFM image

Epithelial cell in liquid, 32 µm x 32 µm AFM image

Gold Nanoparticles, 100 nm

Gold Nanoparticles, 100 nm

Gold Nanoparticles, 20 nm AFM Image

Gold Nanoparticles, 20 nm AFM Image

Graphene sample, AFM image 11 µm x 11 µm

Graphene sample, AFM image 11 µm x 11 µm

Ruled Grating Irregularities, ruled diffraction grating

Ruled Grating Irregularities, 4 µm x 4 µm ruled diffraction grating, irregularities at edges of the apex on grating lines.

Cardiomyocytes; LS-AFM inverted optical microscope

Cardiomyocytes from the LS-AFM inverted optical microsope

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

Mutant bacteria spores; 30 µm x 30 µm.

Mutant bacteria spores; 30 µm x 30 µm.

Donut shaped particles 2.5 µm x 2.5 µm

Donut shaped nanoparticles, 2.5 µm x 2.5 µm.

Gold nanotriangles

Gold nanotriangles

Patterned wafer after CMP; 50 µm x 50 µm

Structures on patterned wafer after CMP; 50 µm x 50 µm

Polished surface, 3D AFM image; 30 µm x 30 µm

Polished surface, 3D AFM image; 30 µm x 30 µm

Three component polymer phase image; 5µm x 5µm

Three component polymer, AFM phase image; 5µm x 5µm

Oriented polypropylene showing network of fibers

Oriented polypropylene showing network of fibers; 10 µm x 10 µm.

Thermoplastics and rubbers blend. Phase image.

Thermoplastics and rubbers blend. AFM phase image shows differentiation of components in sample; 5 µm x 5 µm.

SEBS polymer; phase image 1 µm x 1 µm.

SEBS polymer (styrene/ethylene/butylene polymer); AFM phase image, 1 µm x 1 µm.

SEBS polymer, AFM topography, 1 µm x 1 µm.

SEBS polymer (styrene/ethylene/butylene polymer); AFM topography image, 1 µm x 1 µm.

SEBS polymer, phase image. 500 nm x 500 nm

SEBS polymer, phase image. 500 nm x 500 nm, smallest domains ~10 nm easily visible

Quantum dots, 3D AFM image, 1.5µm x 1.5 µm

Quantum dots, 3D AFM image, 1.5µm x 1.5 µm

Polymer, AFM phase image; 19 µm x 19 µm.

Polymer, AFM phase image; 19 µm x 19 µm.

Silicon wafer, AFM scan; 10 µm x 10 µm.

Silicon wafer, AFM scan; 10 µm x 10 µm.

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Patterned wafer polished by CMP

Patterned wafer polished by CMP 10 µm x 10 µm on left; square shows area selected for AFM scanning at .5 µm x .5 µm. AFM scan reveals pockmarks on surface.

Patterned wafer polished by CMP, 10 µm x 10 µm

Patterned wafer polished by CMP, 3-D color scale. Analysis revealed surface roughness (Sa) of 1.69 nm

Nanoparticles, 3 µm x 3 µm

Nanoparticles, 3D projection 3 µm x 3 µm image w/nanoparticles from 4 nm to 12 nm in diameter

 

SA-AFM Modes

SA-AFM Modes

Standard with every SA-AFM are nonvibrating (NV) mode and vibrating (V) modes for creating topography scans. Additional modes included with the product are lateral force imaging and phase mode imaging. Any scanning mode that can be implemented with a light lever AFM is possible with the SA-AFM.

 

Modes


With the window above the resonance frequency of a cantilever is readily measured. Additionally, the phase characteristics of the probe-sample interaction may be captured.

SA-AFM Options

SA-AFM Options

Dunk and Scan

Open vessel probe holder used for scanning samples submerged in a liquid.

Education Samples

Package of six samples that can help students learn how to operate an AFM, and can help new AFM operators learn various AFM Applications

Vibration Cabinet

Reduces unwanted acoustic and structural vibrations.

Conductive AFM

Measures the 2-D conductivity of sample surfaces.

MFM

Measures the surface magnetic field of a sample.

Lithography

Uses an AFM probe to alter the physical or chemical property of a sample surface.

Advanced Force Distance Curves

Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters such as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.

SA-AFM Specifications

SA-AFM Specifications

 

40 Micron XY Scanner
Type Modified Tripod
XY Linearity < 1%
XY Range > 40µm
XY Resolution < 3 nm closed loop
< 0.3 nm open loop
XY Actuator type Piezo
XY Sensor type Strain Gauge


16 Micron Z Scanner / Probe Holder
Noise < 0.2 nm
Strain Gauge Resolution 1 nm
Tip Angle 10 °
Z Linearity < 5%
Z Linearity-Sensor < 1%


7 Micron Z Scanner / Probe Holder
Noise < 0.12 nm
Strain Gauge Resolution na
Tip Angle 10°
Z Linearity < 5%


Light Lever AFM Force Sensor
Probe Types Industry Standard
Probe Insertion Manual
Probe Exchange Tool
Probe Holding Mechanism Clip
Vibrating Mode Piezo
Electrical Connector to Probe
Laser/Detector Adjustment Range +/- 1.5 mm
Adjustment Resolution 1 µm
Minimum Probe to Objective 25 mm
Laser Type 670 nm Diode, < 3 mW
Laser Focus <25 µm



Detector

Type 4 Quadrant
Band Width > 500 kHz
Signals Transmitted TL, BL, TR, BR
Gain Low, High Settings
Probe sample angle 10 degrees


Digital Data Input Output
Connection USB

Scanning DAC
 
Number 2
Bits 24
Frequency 7 kHz

Control DAC
 
Number 2
Bits 14
Frequency 2 kHz

ADC
 
Number 8
Bits 16
Frequency 48 kHz
Z Motion
Type Direct Drive
Range 25 mm
Drive Type Stepper Motor
Min. Step Size 330 nm
Slew Rate 8 mm/minute
Limit Switch Top, Bottom
Control Software – Rate, Step Size


Analog Electronics
»Vibrating Mode
Freq Range 2 kHz – 800 kHz
Output Voltage 10 Vpp
Demod. Freq TBD


»Z Feedback
Type PID
Bandwidth > 3 kHz
Sample Hold Yes
Voltage 0-150 V


»xy Scan
Voltage 0 – 150 V
Bandwidth > 200 Hz
Pan & Zoom 22 Bits


Software
Environment LabVIEW
Operating System Windows 7
Image Acquisition Real Time Display
(2 of 8 channels)


Control Parameters
PID Yes
Setpoint Yes
Range Yes
Scan Rate Yes
Image Rotate 0 and 90 °
Laser Align Yes
Vibrating Freq. Display Yes
Force Distance Yes
Tip Approach Yes
Oscilloscope Yes
Image Store Format Industry Standard
Image Pixels 16 x 16 to 1024 x 1024
H.V. Gain Control XY and Z
Real Time Display Line Level, Light Shaded,
Grey Color Palette
Calibration System Window
Probe Center Yes



Video Microscope

 
Minimum Zoom
Maximum Zoom
 
Field of view
2 x 2 mm
300 x 300 µm
 
Resolution
20 µm
1.5 µm
 
Working Distance
114 mm
114 mm
 
Magnification
45X
400X
 
 

Computer

 

  • Industry Standard Computer & Monitor (laptop available upon request)
  • Windows 7
  • AFMWorkshop LabVIEW .exe installed

 

 

Stage

SA AFM graphics 4 pm

Back and side view of the SA-AFM stage without the AFM/video microscope. The feet at the bottom may be removed if the stage is rigidly mounted to a surface.

* Z Noise performance depends greatly on the environment in which the SA-AFM is used. Best Z noise performance is obtained in a vibration free environment.

** Every effort is made to present accurate specifications; however, due to circumstances beyond AFM Workshop’s control, specifications are subject to change.

 

SA-AFM Product Datasheet PDF

AFM Money Back Guarantee

See full Atomic Force Microscopes price list

AFMWorkshop Provides a 100% Money Back Guarantee

If our AFMs can't run your application, we will refund the full purchase price!

Additionally, our AFMs are now backed by a two-year, return-to-factory warranty. 

Contact us to take advantage of this offer (888)671-5539 or info@afmworkshop.com 

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