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SA AFM

Standalone AFM
Open design for maximum flexibility

Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.
Price Range*
$45,586.00 -- 
$102,223.00
* Prices vary depending on options purchased, importation taxes, and installation - training fees.

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Description

SA-AFM Details

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Open Frame Design Any sized sample can be scanned
Includes removable bottom plate with XY translator Allows for scanning small samples
Probe Exchange Tool Included Reduce time for probe exchange
Includes top view video microscope Facilitates tip approach and laser alignment
Includes vibrating, non-vibrating, phase, LFM, and F/D Most common scanning modes included for many applications
Universal Probe Holder Can be used with most commercially available probes
LabVIEW software with USB communication Readily adaptable to new operating systems
Pricing From  $42,151*
*Includes the cost of a Z scanner 
Download: SA-AFM Product Datasheet PDFPDF icon
3-D model of SA-AFMPDF icon
SA-AFM by AFMWorkshop

 

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning large samples, routine scanning Of technical samples, and for nanotechnology research. The SA-AFM is a complete system and includes everything required For scanning all sizes and shapes of samples.

Advanced Features:

  • Flexible, stand alone design
  • Scans any sample size
  • Linearized XY piezoelectric scanner
  • Accommodates widest range of standard AFM probes
  • All standard modes, including vibrating, non-vibrating, and phase
  • Direct drive motorized probe approach
  • Intuitive LabVIEW™-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

More Details about the SA-AFM

To read more about the SA-AFM, return to the top of the page and click on the various tabs detailing the SA-AFM and its Stage; Ebox; Software; Video Microscope; Probe Holder; Modes; Options; Specifications; and Images, or download the SA-AFM datasheet.

SA-AFM Stage

High Resolution Z Stage

The direct drive’s Z stage controls motion down to 330nm, assuring optimal tip approach. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

Light Lever Force Sensor

An industry-standard light lever force sensor is utilized in the SA-AFM. The probe holder accommodates the widest range of commercially available AFM probes. The light lever force sensor can make measurements in standard modes, including vibrating, nonvibrating, lateral force, and phase mode

Video Microscope

The high resolution video microscope has a zoom tube which allows a field of view between 2 x 2 mm and 0.3 x 0.3 mm. The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

XY Piezo Scanner

For XY scanning, linearized piezo electric ceramics utilize real time feedback control to assure accurate measurements. The multiple modified tripod design (MMTD) of the XY scanner provides scans with minimal background bow.

Universal Probe Holder

A modular probe holder is used in the light lever force sensor and held in place with a spring clip. Probes can be replaced in less than two minutes with the probe exchange tool. Additionally, the probe holder’s spring clip can be used to supply voltages to the AFM probe for techniques such as conductive AFM.

Stage with XY

Large objects that will not fit in a traditional stage may be imaged with the SA-AFM. In this example, the monitor of a commercial AFM is being imaged.

Stage with XY

SA-AFM stage with XY sample translator for imaging small samples

Stage without XY

SA-AFM stage without the XY sample stage is useful for looking at large samples such as a block of concrete.

Stage

XY Sample stage - The optional base with XY translator gives added flexibility to the SA-AFM. The XY translator range is 12 X 12 mm with a resolution of 1 micron. At the top of the XY translator are magnets for holding standard AFM sample disks.

Electronics in the SA-AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

28-Bit Scanning: With 28-bit scanning, the highest resolution AFM images may be measured. Feedback control using the XY strain gauges assures accurate tracking of the probe over the surface.
Phase and Amplitude Detector Circuit: Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can display phase data while using amplitude for feedback when scanning in vibrating mode.
Signal Accessible: At the rear of the EBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.
Status Lights: At the front of the EBox is a light panel that has seven lights. In the unlikely event of a circuit failure, these lights enable determination of Ebox power supply status.
Precision Analog Feedback: Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.
Variable Gain High Voltage Piezo Drivers: An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.
EBox

Features:

  • Microprocessor for scan generation through 24-bit DACs
  • Low-noise, variable gain high-voltage amplifiers with PID feedback for XY scanning
  • Dimensions: Width 6” | Height 10” | Depth 14”
  • High-fidelity, low noise Z feedback circuits for accurate probe tracking
  • Phase and amplitude detection circuits for vibrating mode AFM
  • Industry-standard National Instruments USB data acquisition board
  • Internally accessible header for signal input/output
  • Eight channels of ADC for monitoring and displaying data with LabVIEW™ software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the SA-AFM to be readily combined with any other instrument using LabVIEW.

 

Pre-Scan Tab

All of the functions required before making a scan are on the pre-scan tab. This includes selecting the scan mode, visual PLD alignment, frequency scan, and automatic tip approach.

 

Pre-Scan Tab

 

 

Topo Scan Tab

Images are acquired using the Topo Scan tab. Parameters selected on the scanning tab include the scan size, scan rate, GPID parameters, and the color scale used for displaying images. Included with the scanning tab is an image buffer capability that facilitates rapid zooming in and out.

 

Scanning Tab

 

 

Modes Tabs

Software control for optional modes such as MFM, EFM, and advanced F/D are found in the modes tabs. The example shown here is of the advanced F/D mode tab. This allows fine control of all the parameters controlling acquisition of force-distance curves, as well as acquisition of F-D curve maps. Mapping of curve sin this way allows the user to locate and visualize regions of the sample with varying properties, such as presence of specific molecules, or mechanical properties.

 

Modes Tab

 

 

Image Analysis Software

Included with the SA-AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze, and display SPM images.

Image Analysis Software

  • Visualization: false color representation with different types of mapping
  • Shaded, logarithmic, gradient- and edge-detected, local contrast representation, and Canny lines
  • OpenGL 3D data display: false color or material representation
  • Easily editable color maps and OpenGL materials
  • Basic operations: rotation, flipping, inversion, data arithmetic, crop, and resampling
  • Leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
  • Value reading, distance, and angle measurement
  • Profiles: profile extraction, measuring distances in profile graph, and profile export
  • Filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, and checker pattern removal
  • General convolution filter with user-defined kernel
  • Statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, and facet orientation analysis
  • Statistical quantities calculated from area under arbitrary mask
  • Row/column statistical quantities plots
  • ISO roughness parameter evaluation
  • Grains: threshold marking and un-marking, and watershed marking
  • Grain statistics: overall and distributions of size, height, area, volume, boundary length, and bounding dimensions
  • Integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), and wavelet anisotropy detection
  • Fractal dimension analysis
  • Data correction: spot remove, outlier marking, scar marking, and several line correction methods (median, modus)
  • Removal of data under arbitrary mask using Laplace or fractal interpolation
  • Automatic XY plane rotation correction
  • Arbitrary polynomial deformation on XY plane
  • 1D and 2D FFT filtering
  • Fast scan axis drift correction
  • Mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, and shrinking
  • Simple graph function fitting, critical dimension determination
  • Force-distance curve fitting
  • Axes scale calibration
  • Merging and immersion of images
  • Tip modeling, blind estimation, dilation and erosion

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The SA-AFM includes a high performance video optical microscope along with a 3 camera, light source, microscope stand, and Windows software for displaying images.

SA-AFM Video Optical Microscope shows test structureHere the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

SA-AFM Video Microscope on HOPGThe video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

7 to 1 Mechanical Zoom

SA-AFM laser alignment through video microscope

SA-AFM laser alignment through video microscope

With a 7:1 mechanical zoom, it is possible to use a large field of view to locate features for imaging. It is then possible to zoom in to get very high resolution video microscope images.

 
 

SA-AFM Introduction from AFMWorkshop on Vimeo.

PROBE HOLDER/EXCHANGE

The SA-AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool.

This combination makes changing probes fast and easy on the SA-AFM.

Step 1 - Pull the probe clip back, place the probe on the probe holder
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STEP 1
Pull the probe clip back, place the probe on the probe holder

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 .

Step 2 - Lift the clip up and move it forward over the probe chip

STEP 2
Lift the clip up and move it forward over the probe chip

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 .

Step 3 - Drop the probe clip onto the probe clip

STEP 3
Drop the probe chip onto the probe clip

 .

 .

SA-AFM Measurements

In addition to measuring surface structure, the SA-AFM is ideal instrument for modes measurements. 

For example these images are of a polymer sample.  The image at left is a topography image, and the image at right is the phase image, measuring the relative hardness of the polymer sample.

AFM System topography image AFM system measuring of the relative hardness of the polymer sample

 

 

Surface Texture

SA-AFM 2 pm measuring of semiconductors and other micro-fabricated devices

 Polished Surface - 30 x 30 x 5 µm

 

Surface texture on polished and machined surfaces is readily measured with the SA-AFM. With the SA's flexible stage design, fixtures for holding almost any sample shape can be created. Once measured, the AFM images can be analyzed and standard surface texture parameters such as Ra are readily calculated.

Dimensional

SA-AFM 2 pm measuring of semiconductors and other micro-fabricated devices

 Calibration reference - 40 x 40 x 1 µm

 

Atomic force microscopes are capable of accurately measuring the dimensions of semiconductor and other micro-fabricated devices. Because the SA-AFM accommodates commercially available AFM probes, specialized probes for metrology measurements can be used.
 

Visualization

cells SA-AFM-PM

Cells - 8 x 8 µm

One of the most powerful capabilities of the SA-AFM is the capability to visualize surface structure. Although not easily quantified, the surface texture of this cell structure is readily visualized.

Features that may be readily visualized with the SA-AFM range in size from a few nm to a few µm.

The SA-AFM includes the MOST COMMONLY USED AFM MODES.

They are:

Vibrating (Tapping)
Vibrating Mode (tapping) Vibrating mode imaging is the most commonly used mode for measuring topography images with an AFM. In vibrating mode the vibration amplitude of the probe is held constant during a scan. Adjustable parameters include the vibrating frequency, amplitude of vibration, and the amount of dampening of the vibrating probe.

 

Non-vibrating (Contact)
Non-vibrating Mode (contact) In non-vibrating mode, commonly called contact mode, the deflection of a cantilever is held constant during scanning. This mode is often used for scanning in liquids and is also used for measuring force-distance curves.

 

Phase Mode
Phase Mode Phase mode images are measured in vibrating mode and are useful for identifying different areas of hardness on a surface. The technique operates by measuring the phase change caused by differing materials on a surface while scanning.

 

Lateral Force
Lateral Force Lateral force mode measures the local friction a probe senses as it is scanned across a surface. The friction can be caused by surface texture and differing chemical composition.

 

Basic Force/Distance
Basic Force/Distance Force-Distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This simple AFM module allows measurements of force-distance curves. It can be upgraded to the Advanced Force-Distance module (see below).

 

 

Optional Modes

OPTIONAL MODES that can be purchased with the SA-AFM include:

Magnetic Force
Magnetic Force Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.

 

Electric Force
Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. “Dynamic” here means that the cantilever is oscillating and does not make contact with the sample. This force arises due to the attraction or repulsion of separated charges.

 

Advanced F/D
Advanced F/D Force-distance curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: adhesion, stiffness, compliance, viscoelasticity, and surface layer thickness. This advanced AFM module is flexible and enables many types of experiments.

 

Force Distance Curve Analysis Software
Force Distance Curve Analysis Software ISFVEM is a fast, intuitive software program for the analysis of a single force distance curve or a grid of curves generated with the AFMWorkshop advanced force distance acquisition software.

 

Conductive AFM
Conductive AFM The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface. This can be highly useful in development of microelectronics.

 

Lithography
Lithography This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFM Control software. This software allows the customer to design their own nanolithographic patterns to be written to the sample surface. VI’s are available to customers who want to modify the software and create new capabilities.

 

Open Liquid Cell
Open Liquid Cell This option includes a special probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-2 probe holder.

 

Scanning Kelvin Probe Microscopy (SKPM)
Scanning Kelvin Probe Microscopy (SKPM) SKPM measures the potential difference between a conductive probe and a conductive sample. The SKPM measurement is made by monitoring the output of a feedback loop that adjusts the potential on a probe so that the potential difference between the probe and surface is zero.

 

Scanning Tunneling
Scanning Tunneling Microscopy (STM) n the STM, the current flow between a metal probe and a sample is used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample’s surface is measured. This also allows measurement of localized I/V curves.

SA-AFM Options

Although the SA-AFM comes with everything you need to make AFM images, several additional options are available. AFMWorkshop regularly develops new options.

Optional Modes

Electrical Modes

Liquid Modes

Other Modes

Probe Holder

Optional Features

Image Logger

This option allows display of six channels in the forward and reverse direction. It has a spectrum function as well as a six channel data logger

Break Out Box

BNC gives access to most of the signals in the Ebox.

Scanner

There are two scanners available for the SA-AFM.They are:

Q-Box/Q-Base

The Q-Box is a unique vibration solution that reduces both sound and structural vibrations. It features a unique adjustable elastomer suspension system which is optimal for atomic force microscopes.

Q-Box

50 MICRON XY SCANNER

Type Modified Tripod
xy Linearity < 1%
xy Range > 50 μm
xy Resolution < 3 nm closed loop
< 0.3 nm open loop
xy Actuator type Piezo
xy Sensor type Strain Gauge

 

17 MICRON Z SCANNER / PROBE HOLDER

Noise < 0.2 nm
Strain Gauge Resolution 1 nm
Tip Angle 10°
Z Linearity < 5%;
Z Linearity-Sensor < 1%

 

7 MICRON Z SCANNER / PROBE HOLDER

Noise < 0.12 nm
Strain Gauge Resolution na
Tip Angle 10°
Z Linearity < 5%;

 

LIGHT LEVER AFM FORCE SENSOR

Probe Types Industry-standard
Probe Insertion Manual
Probe Exchange Tool
Probe Holding Mechanism Clip
Vibrating Mode Piezo
Electrical Connector
to Probe
Laser/Detector Adjustment Range +/- 1.5 mm
Adjustment Resolution 1 μm
Minimum Probe to Objective 25 mm
Laser Type 670 nm Diode, < 3 mW
Laser Focus < 25 μm
Detector
Type 4 Quadrant
Band Width > 500 kHz
Signals Transmitted TL, BL, TR, BR
Gain Low, High Settings
Probe sample angle 10°

 

SOFTWARE

Environment LabVIEW™
Operating System Windows
Image Acquisition Real Time Display
(2 of 8 channels)
Control Parameters
PID Yes
Setpoint Yes
Range Yes
Scan Rate Yes
Image Rotate 0° and 90°
Laser Align Yes
Vibrating Freq. Display Yes
Force Distance Yes
Tip Approach Yes
Oscilloscope Yes
Image Store Format Industry-standard
Image Pixels 16 x 16 to 1024 x 1024
H.V. Gain Control XY and Z
Real Time Display Line Level,
Light Shaded,
Grey Color Palette
Calibration System Window
Probe Center Yes

 

* Z Noise performance depends greatly on the environment the SA-AFM is used in. Best Z noise performance is obtained in a vibration free environment.

** Every effort is made to present accurate specifications, however, due to circumstances beyond AFMWorkshop’s control, specifications are subject to change.

DIGITAL DATA INPUT OUTPUT

Connection USB
Scanning DAC
Number 2
Bits 24
Frequency 7 kHz
Control DAC
Number 2
Bits 14
Frequency 2 kHz
ADC
Number 8
Bits 14
Frequency 48 kHz

 

Z MOTION

Type Direct Drive
Range 25 mm
Drive Type Stepper Motor
Min. Step Size 3330 nm
Slew Rate 8 mm/minute
Limit Switch Top, Bottom
Control Software – Rate,
Step Size

 

ANALOG ELECTRONICS

Vibrating Mode
Freq Range 2 kHz – 800 kHz
Output Voltage 10 Vpp
Demod. Freq TBD
Z Feedback
Type PID
Bandwidth > 3 kHz
Sample Hold Yes
Voltage 0 – 150 V
Z Feedback
Voltage 0 – 150 V
Bandwidth > 200 Hz
Pan & Zoom 22 Bits
Tip Approach Cutoff < 20 μm sec.

 

VIDEO OPTICAL MICROSCOPE SPECIFICATIONS

  Minimum Zoom Maximum Zoom
Field of View 2 x 2 mm 300 × 300 µm
Resolution 20 µm 2 µm
Working Distance 114 mm 114 mm
Magnification 45 × 400 ×

 

COMPUTER

Industry-standard Computer & Monitor (laptop available upon request)
Windows
AFMWorkshop LabVIEW.exe installed

 

STAGE

Stage

 

Back and side view of the SA-AFM stage without the AFM/ video microscope. The feet at the bottom may be removed if the stage is rigidly mounted to a surface.

 

SA-AFM Product Datasheet PDF PDF icon

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AFMWorkshop provides a 100% money back guarantee. If our AFM's can't run your application, we will refund the full price*.

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AFMWorkshop stands behind its products. We offer a two year return to factory warranty with every AFM we offer.

 

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South Carolina, 29926

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