|Open Frame Design||Any sized sample can be scanned|
|Includes bottom plate||Allows for scanning small samples|
|Probe Exchange Tool Included||Reduce time for probe exchange|
|Includes top view video microscope||Facilitates tip approach and laser alignment|
|Includes vibrating, non-vibrating, phase, LFM, and advanced F/D||Most common scanning modes included for many applications|
|Flexible Sample holder||Can be used with most commercially available probes|
|Labview software with USB communication||Readily adaptable to new operating systems|
*Plus selected Z Scanner
|Download:||SA-AFM Product Datasheet PDF
3-D model of SA-AFM
Overview: Stand-Alone Atomic Force Microscope (SA-AFM)
Use the SA-AFM for scanning almost any size and sape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has an linearized XY scan range of 40 microns, and two different Z ceramics: a 7 micron high resolution Z scanner, and a large motion 17 micron Z scanner.
Advanced Features of the SA-AFM Include:
Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.
More Details about the SA-AFM
To read more about the SA-AFM, return to the top of the page and click on the various tabs detailing the SA-AFM and its Stage; Ebox; Software; Video Microscope; Probe Holder; Modes; Options; Specifications; and Images.