AFM Workshop

Atomic Force Microscope Manufacturer

Advantages of Atomic Force Microscopes for Polymer Characterization Imaging

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  • No sample preparation required

    Because AFM works on insulating materials, polymer samples can be directly imaged. There is no need to coat the sample as for SEM.

  • Direct visualization of 3D topography

    The AFM gives three dimensional images in the horizontal and vertical axes. Not only can you visualize surface features, you can measure their height.

  • With phase mode, substructure is imaged

    Phase mode measures the compliance map of a polymer’s surface. A topography map and surface compliance map are measured simultaneously.

 

  • Nanometer scale images in liquid

    Polymer samples can be directly imaged while submerged in a liquid.

Nanometer scale

 

Images of Polymeric Materials

Height image of biaxially oriented polypropylene fiber film (BOPP).

Height image of biaxially oriented polypropylene fiber film (BOPP). The very fine structures in this polymer film are imaged. 2µmx2µm image, with a 29 nm height scale in z.

Phase image of filled polymer film.

Phase image of filled polymer film. The height is from topography, and the color from phase signal. Several different filler materials, as well as the surface texture can be visualized at the same time.

 

SBS block copolymer captured with AFM

SBS block copolymer. AFM allows easy visualization of the phase separation in this block copolymer. This is a height image, showing a 1.7µm x 1.7µm area, the height scale is 21 nm.

Phase-separated polymer blend film – polysytrene and polymethylmethacrylate -PS/PMMA.

Phase-separated polymer blend film – polysytrene and polymethylmethacrylate -PS/PMMA. AFM makes it simple to distinguish between the two phases. Topography image showing 4µm x 4µm area. The height scale is 23 nm.

 

Polymer Characterization Techniques

Keywords

Sharp probe scan

 

In the AFM instrument, a sharp probe is scanned over a surface. The motion of the probe is captured by a computer, an the line profiles are used to create a surface topogram.

Phase mode image

 

A phase mode image is created by monitoring the amplitue and phase of a vibrating probe as it is scanned across a suface. A change in the amplitude/ phase occurs when the probe scans of areas of varying hardness.

AFM Polymer Image, BOPP AFM Image, Polymer Film Image, SBS AFM Image, Blended Polymer Film AFM image, plastics, microscope images, Polymer Characterization, Polymer characterization techniques, Polymer research, Polymer science, Polymeric materials, Polymer materials

 

 

AFMWorkshop AFM Products for Polymer Imaging

TT-2 AFM
HR AFM

 

Our Users Selected References: AFM for Polymer Characterization (2016)

Additional AFMWorkshop Polymer application information

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