Scanning Tunneling Microscopy

Model ID: STM-2017

Download Datasheet

STM has great historical significance as it was the first type of scanning probe microscope developed by IBM researchers in Switzerland.

Further, the inventors of the STM received the Nobel Prize for it’s discovery. Today, in ambient air, most scanning probe microscope images are made with AFM The STM-2017 module is used for measuring STM images in the TT-2, NP, LS, and SA-AFM products.

In the STM, the current flow between a metal probe and a sample are used to control the distance between the conductive probe and conductive surface. When the probe is scanned across the surface, if the current between the probe and surface are held constant with a feedback control loop driving a piezo ceramic, the topography of the sample’s surface in measured.

In an STM, a voltage is applied between the probe and surface. A current to voltage converter outputs a voltage (Vout) that is proportional to the distance between the probe and sample.

In the STM Control software pictured above, on the left side of the screen the voltage driving the Z piezo is displayed on the left, and error in the current signal is displayed on the right.

Included with STM Option:

• Probe Holder
• Tungsten Probes
• Sample Holder with Clip
• Current Amplifier
• Interface Box
• Cables
• Manual

Probe Holder

The STP probe holder replaces the AFM probe holder in the TT-AFM.
The red arrow in this picture points to the probe holder.

Interface Unit

Control Software