AFMWorkshop's TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. Below we highlight a few recent articles where researchers are utilizing the TT-AFM for work on polymers in biomedical and electronic device applications.
Exploring the effect of liquid-phase assembly on formation of conducting polymer films
In this work, scientists use tapping mode atomic force microscopy conducted with a TT-AFM, among other techniques, to study the morphology and structures of P3HT films formed in a variety of solvent mixtures. Read More
Reference: Gordon, M. P., et al. (2015). "Poly (3-hexylthiophene) films prepared using binary solvent mixtures." Journal of Polymer Science Part B: Polymer Physics.
Polymer microparticles synthesized using naturally derived cross-linkers
By modifying synthetic polymers with naturally derived moieties, the best of both worlds can be brought together for effective drug delivery. The authors cross-link a synthetic polymer (styrene) using a naturally derived component (sucrose) as the cross-linker. Using a TT-AFM, atomic force microscopy characterized the resulting polymer microparticles and the effects on the structures from such processing conditions as particle concentrations, solvent, and drying. Read More
Reference: Raposo, C. D., et al. (2015). "Synthesis of cross-linked polymeric microparticles containing hexa-O-benzylsucrose." Designed Monomers and Polymers 18(8): 753-760
Characterization of natural resource based polymer structures
The authors designed and synthesized biocompatible polymers from the natural building block of sucrose-containing polymers. A TT-AFM operating in vibrating mode in ambient conditions was used to image the resultant polymer films. Read More
Reference: Petrova, K. T., et al. (2014). "Amide-linked N-methacryloyl sucrose containing polymers." Carbohydrate Polymers 110: 38-46.
Nanoscale characterization of polymer nanoparticles for biomedical applications
The authors synthesized polymer nanoparticles from polyethylene glycol (PEG), a biocompatible polymer. They modified these nanoparticles to facilitate binding to the desired cell and to include a drug incorporation site. Using a TT-AFM operating in vibrating mode under ambient conditions, the authors successfully characterized both the shape and size of their polymer nanoparticles synthesized from polymers of different molecular weight. Read More
Reference: Crucho, C. I. and M. T. Barros (2014). "Surfactant-free polymeric nanoparticles composed of PEG, cholic acid and a sucrose moiety." Journal of Materials Chemistry B 2(25): 3946-3955.
May 10 - 11, 2016. Boston, Massachusetts
AFMWorkshop and Dalia Yablon, Ph.D. are pleased to partner again this year in a polymer applications-oriented atomic force microscopy course just outside of Boston, Massachusetts in May, 2016.
The two day course mixes lecture with labwork on the basics of atomic force microscopy and its speciﬁc application to imaging polymer materials. AFM hardware and software will be reviewed, with special emphasis on the imaging modes and image processing needed to study polymer materials. Attendees with any make or model of AFM are welcome.
The course is led by Dalia Yablon, Ph.D., a physical chemist with 15 years of experience in the field of scanning probe microscopy (SPM). Dalia's 2013 book Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization was published by Wiley. Dr. Yablon spent over a decade leading a state of the art scanning probe microscopy/nanomechanical characterization facility at ExxonMobil Corporation's flagship R&D center. In 2013, Dalia founded SurfaceChar, a scientific consulting company in the greater Boston area specializing in surface and interface characterization and measurement with a focus on scanning probe microscopy/atomic force microscopy.
REGISTER by April 1 for an early bird discount !