Atomic Force Microscope Manufacturer

AFMWORKSHOP STEM Resources

We understand that purchasing an AFM is a major decision. AFMWorkshop is here to help as your partner in educating students about the nano-world. We will support you as an educator while you learn more about this exciting technology along with your students. We can connect you with other educators using AFM in the lab and classroom, and will guide you through learning concepts with instrument tutorials, application briefs, and teaching materials for a strong educational program. We understand that an AFM for education needs to be robust, easy to use, and involve very low maintenance costs. Tools we can share via this website include the following (this list is always evolving!)

Atomic Force Microscopes (AFMs) offer students the opportunity to measure and visualize Nanoscale surface features with magnifications in the 100,000,000 x range. The AFM Educator’s Cookbook is a practical guide to Atomic Force Microscopes, and describes several interesting samples that students can image with an AFM. Each section of the Educator’s Cookbook offers example AFM images from the selected samples, as well as other important information including: where to purchase the samples; how to prepare the samples for AFM imaging; and how to process the resulting AFM images.

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Free Poster from AFMWorkshop

Here's a great resource for new AFM users and for STEM Educators. Available in a wide variety of sizes.

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Learn how an atomic force microscope works. In these simple animated tutorials, you will learn the basics of how an AFM is operated, and the technology that makes it possible. The underlying theory and design of AFM is also covered, including the differences between vibrating (tapping) and non-vibrating (contact) modes. You can also download these animations for your use in educational settings. Researchers, educators, and students around the globe have voiced their appreciation for the unique and immediately useful knowledge communicated through the AFMWorkshop animated tutorials.

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this recording from a livestreaming seminar.

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this recording from a livestreaming seminar.

AFM users need to plan around the fact that in ambient air, surfaces have a contamination layer comprised of hydrocarbons and water vapor. Depending on the local environment, the thickness of the contamination layer can vary between a nanometer and tens of nanometers.

AFM operators must choose from a wide array of probe types when scanning samples. This video recording from a live streaming AFM seminar covers the probe types that work best for varying types of samples.

Getting the most from your AFM requires effective utilization of image processing software. This video recording of a live-streaming seminar covers how to level images, display images, and analyze images with AFM image processing software. The demonstration utilizes Gwyddion's open source software.

An inability to detect artifacts vs. actual sample material can undermine the validity of your research. This AFM video seminar reviews the most common artifact issues and their sources.

Going from 1mm to .1nm is comparable to flying 380,000 km to the moon and stopping just 38 meters above the surface. This video demonstrates the "Woodpecker" tip approach method which minimizes the chances of damaging samples and probes upon preparing for imaging scans.

Atomic Force Microscopy, Oxford University Press, by Peter Eaton- Lincoln University and Paul West – AFMWorkshop.

"This book can be called a practical introduction to atomic force microscopy (AFM). It is outstanding among those written on this subject. I have worked with AFM starting from the year of its invention, and have seen books written quite formally. This book is written by true experts with a deep knowledge of the AFM technique. This is structured as a sort of "super manual." I wish I had such a useful text when learning this technique."

- Professor Igor Sokolov, Tufts University in MRS Bulletin

We highly recommend this best selling book! To Purchase click HERE!

A brief overview of Atomic Force Microscopy, from the book:

1. How does Atomic Force Microscopy Work?
2. What is the resolution of an Atomic Force Microscope?
3. How are AFM images displayed?
4. What is the difference between Contact and Tapping AFM?
5. What is Phase Mode imaging?
6. How does Lateral Force Microscopy work?
7. Why are Force-Distance curves important?
8. Is an AFM easy to operate?
9. How long does an AFM probe last?
10. What is the difference between AFM and SEM?