Atomic Force Microscope Book
Atomic Force Microscopy from Oxford University Press
Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.
This book will demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.
- A very practical guide to Atomic Force Microscopy
- Authors have unique insight into the field
- Combination in one book of AFM theory, principles, practice, techniques and application of AFM
- Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
- Insight on how instrumental design influences performance, and instrument use
- Section on how to recognise, and avoid, AFM artifacts
- Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.
Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.
Igor Sokolov, Tufts University, in MRS Bulletin, April, 2014:
“...this is an excellent book which I highly recommend to beginners as well as experts. The beginners will find a great introduction to and detailed practical guide for various AFM techniques. The expert could fill possible gaps in knowledge and gain new ideas.
It is outstanding among those written on this subject....written by true experts with a deep knowledge of the AFM technique.”
Udo D. Schwarz, Yale University, in Physics Today, April 2011:
“As a frequent AFM user, I've been often asked, 'is there a book you recommend for students who are new to AFM techniques?' For a long time there wasn't, but now there's Atomic Force Microscopy.
Of course, many other AFM-related books have been written, but they are either edited books in thematic series, books that focus on certain applications or specific operational modes, or books that are heavy on AFM theory but light on practical recipes. Operation manuals are often a great place to start, but they vary in quality and focus on the manufacturer's hardware, thereby sacrificing the broader picture.
Atomic Force Microscopy provides the basic knowledge necessary for successful AFM operation while avoiding the trap of providing more detail than beginners can handle. It boasts seven chapters, each of them accessible and self-contained; readers can thus cherry-pick the topics of relevance for their specific problems....
Atomic Force Microscopy is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users.”
Table of Contents
Appendix A: AFM Standards
Appendix B: Scanner Calibration and Certification Procedures
Appendix C: Third Party AFM Software Index
Publication Date: May 20, 2010
ISBN-10: 0199570450 | ISBN-13: 978-
Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology, nanoscience courses.