Nanoparticle Characterization with Atomic Force Microscopy

Click to Submit Inquiries or Questions


Atomic Force Microscopy to Characterize Nanoparticles

Two Day Training Course, April 29-30, 2015

Taught by Dalia Yablon, Ph.D.

Norwood, Massachusetts

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods. The AFM provides powerful information on size, distribution, and geometries of nanoparticles.

Some of the unique advantages of nanoparticle characterization with an AFM include:

  • Characterization of nanoparticles that are .5nm and up.
  • Nanoparticle mixture distributions below 30 nm.
  • Characterization of variable geometry nanoparticles.
  • Direct visualization of hydrated nanoparticles/liquid medium.
  • Characterization of nanoparticle physical properties such as magnetic fields.

This two day AFMWorkshop course mixes lecture with labwork on atomic force microscopy operation specifically as it applies to characterizing nanoparticles. AFM hardware and software will be reviewed, with special emphasis on the imaging modes and image processing needed to study nanoparticles. We will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, however attendees with experience on any make of AFM instrument will find the labwork relevant and practical.

AFM scan of nanoparticles AFM scan of nanoparticles

Topics to Be Covered:

  • Overview of AFM operation and different modes Topography measurements on nanoparticles.
  • Nanoscale resolution
  • Overview of AFM hardware
  • Overview of AFM software
  • Imaging modes for nanoparticles
  • Imaging artifacts and best practices
  • Image processing for important measurements on nanoparticles


  • Scanning standard and reference samples.
  • Nanoparticle imaging and image processing.
  • AFM calibration

About the Instructor

Dalia YablonDalia Yablon is a physical chemist with 15 years of experience in the field of scanning probe microscopy (SPM). Dalia's 2013 book, Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization, was published by Wiley.  Dr. Yablon spent over a decade in the energy industry developing and leading a state of the art scanning probe microscopy/nanomechanical characterization facility at ExxonMobil Corporation's flagship R&D center in New Jersey. During this time, she developed and applied SPM methods to characterize, conduct failure analysis, and probe structure-property relationships across various sectors of ExxonMobil's business including polymers, tribology, corrosion, geochemistry, and metallurgy. In 2013, Dalia founded SurfaceChar, a scientific consulting company in the greater Boston area specializing in surfaces and interfaces characterization and measurement with a focus on scanning probe microscopy/atomic force microscopy.

Dr. Yablon holds an A.B. in Chemistry from Harvard University and a Ph.D. in physical chemistry from Columbia University.


Register or contact us for more information.


Class Size is limited to 10 Students

Course Price is

    • $1495 before April 1st
    • $1750 after April 1st

Get details


Search for mobile