This website is using cookies
We use cookies and other tracking technologies to improve your browsing experience on our website, to show you personalized content and targeted ads, to analyze our website traffic, and to understand where our visitors are coming from. By browsing our website, you consent to our use of cookies and other tracking technologies.
×

SHOCONA AFM/SPM Probe

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

Click to Submit Inquiries or Questions

Description

Model ID: SHOCONA-10

SHOCONA AFM Probes are designed for contact mode applications with a shorter length, providing better sensitivity without compromising on spring constant requirements. The reflex side is coated with aluminum for increased laser signal quality.

Tip Specifications

Material: Silicon
Shape: Pyramidal
Height (µm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (nm): 6
Coating: None

Cantilever Specifications

Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 50 nm ± 5 nm

 

Parameter Nominal Value Minimum Value Maximum Value
Spring Constant (N/m) 0.14 0.01 0.60
Frequency (kHz) 21 8 37
Length (µm) 225 215 235
Width (µm) 46 41 51
Thickness (µm) 1.0 0.5 1.5

 

Download: SHOCONA AFM Probe Datasheet PDF

 

×

Search for mobile


TOP