AFM Probes

Atomic Force Microscope Probes

Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force distance scanning. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

AFMWorkshop offersAFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only.