Force Distance Curve Analysis Software
force distance curve or a grid of curves generated with the AFMWorkshop advanced force distance acquisition software.
ISFVEM is a user-friendly graphical user interface (GUI)-based high-throughput atomic force microscopy (AFM) force measurements analysis software designed for the analysis of a large amount of force volume spectroscopy data. It is intended for automated analysis, visualization and organization of force-distance curves obtained during AFM measurements, thus bypassing the need to analyze the force data manually.
ISFVEM main analysis interface elements:
Box 1: Height image calculated from dataset under analysis.
Box 3: Curve analysis control and parameters.
Box 2: Current analysis results from dataset.
Box 4: Current curve display
ISFVEM provides a large number of force-curve visualization options, including functions for basic statistical analysis. It is written in the MATLAB language using event/object programming to provide an alternative and easy-to-use tool for basic or advanced analysis of AFM force volume data. The graphical user interface does not require knowledge of the MATLAB language.
ISFVEM version 6.0 is composed of 3 interacting interfaces (Force Volume, Adhesion and Elasticity) in order to analyze AFM force data connected to morphology. The data analysis allows the user to be in control in each step of analysis and to interact (e.g., changing parameters, graphical representations) with the process.
This package is suitable for all AFM users with nanomechanics experience, whether an AFM beginner who may want to quickly process data, or an expert who may want to take control of the details of analysis. The software elements interact with each other in order to manipulate and visualize data where morphology, adhesion and mechanical properties are often interconnected. During analysis, the user can export all results to save time during the process, or quickly reloaded previous analyses. Overall, the software is suitable for high-throughput AFM force measurements by analyzing large amounts of data (e.g., 4096) within a minute.
- Polymer Extension Mapping
- Unbinding Extension Mapping
- Adhesion Mapping with Shadowing
- Elasticity Mapping
- Force Volume Image with Analysis
- Work of Detachment
- Advanced Contact Definition
- Force Filter
- Automatic and Manual Sensitivity Correction
- Real Time Interactive
- Reject bad curves
- Reject poor nanoindentation fitting
- Deflection Sensitivity Control
- Notes with Data
- Active Curve Selection
- Map Select - Image Select Toggle
- Multiple Force Curve Extraction
The Force Profile Window shows all detected adhesion events (purple) in the retract line of the selected force curves.
The Nanoindentation interface shows the extend line (Panel 3) and the fitted indentation depth (Panel 4) of selected force plots. The two movable vertical lines in Panel 3 define the indentation depth for fitting. Using the mouse, you can resize or move the fitted area. Following the depth selection, a Data Fit appears in Panel 4 which indicates that the software is ready for fitting the indentation data. Fitting results are then displayed in Panel 4 as Young’s modulus value, Quality of fit, and root mean-square deviation. Poorly fitted data can be automatically omitted from calculations.
Finally, upon successful fitting, the corresponding pixel in the Young’s Modulus Map is updated with the calculated Young’s modulus value. The generated Young’s Modulus Map shown here was fully processed automatically within 1 minute, where 4096 force profiles were involved in calculations.
Operating System: Windows 10 or up
Distribution: Download from Server
Security: Key Coded for Single Use
License: Continuous for Features Purchased
- Executable File
- Example F/D Image File