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AFM Modes

Atomic Force Microscope Modes

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.

Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM. AFMWorkshop instruments come with many options included.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option...

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Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of...

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Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface....

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Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance...

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Environmental Cell

Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with...

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Dunk and Scan Liquid Cell and Probe Holder for TT-AFM

A probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace...

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