Modes

All atomic force microscopes manufactured by AFMWorkshop include standard scanning modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance.. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option...

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Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of...

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Lithography

This Lithography software option enables the AFM probe to alter the physical or chemical properties of the surface....

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Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance...

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