Atomic Force Microscope Modes
All atomic force microscopes manufactured by AFMWorkshop include standard scanning modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance.. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.
AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.