16 Micron Z Piezoelectric Ceramic/Probe Holder with Strain Gauge

For the LS, NP and SA-AFM. Z piezoelectric/probe holder with strain gauge. Designed for general AFM applications, and for applications requiring force distance curves.

$5,995.00

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Description

Tip Scanning Z / Probe Holder

Model ID: TS-Z16 

AFMWorkshop’s tip scanning atomic force microscopes include the SA-AFM, the NP-AFM, and the LS-AFM. These systems all use an independent Z piezoelectric ceramic/ probe holder module. AFMWorkshop offers two probe holders for tip- scanning atomic force microscopes that are interchangeable and designed for different applications.

 

 

 Both Z probe holders include a probe exchange guide which facilitates probe exchanges. To exchange probes, the probe module is simply placed on top of the exchange guide, light pressure is applied, the guide then releases the probe clamping spring, and the probe is then easily exchanged.

 

 

 

The TS-Z16 module is designed for general AFM applications, and for applications requiring force distance curves. Applications include life sciences, material sciences, and technical applications that do not need the ultimate noise floor.

 

MODEL Z RANGE NOISE FLOOR* STRAIN GAUGE APPLICATIONS
TS-Z16 >16 μm 0.20 nm  Yes General Scanning
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