• Overview
  • Stage
  • EBOX
  • Software
  • Video Microscope
  • Probe Holder
  • Images
  • Modes
  • Options
  • Specifications
Sample Sizes: Up to 1" X 1" X 3/4"
Standard Scanning Modes: Vibrating(Tapping), Non Vibrating (Contact), Phase, LFM
Scanners: 50 x 50 x 17 µm, 15 x 15 x 7 µm
Video Optical Microscope: Zoom to 400X, 2 µm resolution
Stage and Ebox Size: Compact table top design
Download: TT-2 AFM Product Datasheet PDF

 

TT-2 AFM Overview

With a Z noise floor of 0.08 nm, the TT-2 AFM is capable of high resolution scanning

Samples such as DNA, nanoparticles and nanotubes are measured with the TT-2 AFM.

This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM and includes everything required for high-resolution scanning in one low price. The TT-2 AFM is:

For Nanotechnology Researchers

Wanting to do routine scanning of nano-structures...Read More 

For Engineers

AFMs are essential for process development and control applications in advanced technology industries... Read More 

For Instrument Innovators

Using AFM as a platform to create a new instrument...Read More 

For Educators

Teaching students about AFM construction, operation, and applications...Read More 

Example Application of the TT-2 AFM: Analysis of Si Atomic Terrace Sample

The vertical resolution of the TT-2 AFM can be demonstrated with an Si test sample that is a misorientation surface from the Siplane ~ 1(deg). The test sample includes two step sizes; the largest terrace of 50 nm can be visualized with the TT-2 AFM video microscope. The sample also includes single atomic steps of .314 nm. Several TT-2 AFM advantages and features are demonstrated by the analysis of the Si sample.

AFM cantilever over atomic terraces, video microscope

Video microscope image of the cantilever and Si atomic terrace sample. The lines visualized in the video microscope image are the 50 nm terraces on the sample surface. With the AFM, the smaller atomic steps are found on the terraces.

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TT-AFM scan of Si terraces 4 µm x 4 µm

This 4x4 um image of Si silicon shows a Z scale of 1.8 nm. Each of the grey color scales represents a single atomic step of 0.314 nm.

The blue square shows the area in which the surface texture was measured.

A red circle designates a defect. The line profile for the circled defect is illustrated below.

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TT-AFM histogram of terrace heights on Si sample

This histogram analysis shows the height of each of the terraces on the sample. A step height of 0.303 nm is measured.

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Si2RMSnumbers

Surface texture parameters for the image are calculated for the region designated with the blue box. The expected value for the surface roughness (Ra) for this sample is 0.06 nm.

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Si2DefectPM
Si2Defectheight

A line profile of the defect designated by the red circle in the image is 0.471 nm in height. This defect was visualized in repetitive images of the same surface area.

 

Additional Applications with the TT-2 AFM

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for industry, research and education can be found by clicking on any of the links below:
Photonics Applications
Polymer Applications
Nanoparticle Applications
Life Sciences Applications
Process Development and Process Control Applications
Education Applications

TT-2 AFM Videos

A 40 minute recording of a livestreaming TT-2 AFM demonstration is available here, along with a series of brief, two-minute introductory videos of the TT-2 AFM and its components here.

Open Design

An open design is at the core of all products offered by the AFM Workshop. New types of experiments are more readily designed and implemented through the use of LabVIEW software. All the mechanical drawings for the TT-2 AFM are available in the documentation package option. Finally, AFMWorkshop's Customer Forum allows the company to share specialized designs developed for the TT-2 AFM directly with all customers. For specialized applications, other types of scanners such as flexure and tubes can be easily added to the microscope stage.

More Details about the TT-2 AFM

To read more about the TT-2 AFM, return to the top of the page and click on the various tabs detailing the TT-2 AFM components, or click on the following links:

TT-2 AFM Stage

TT-2 AFM Ebox

TT-2 AFM Software

TT-2 AFM Video Microscope

TT-2 AFM Probe Holder

TT-2 AFM Modes

TT-2 AFM Options

TT-2 AFM Specifications

TT-2 AFM Image Gallery

TT-2 AFM Stage

The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

Rigid Frame Design

The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.

Light Lever AFM Force Sensor

Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.

Integrated Probe Holder/Probe Exchanger

A unique probe holder and clipping mechanism allows quick and easy probe exchange.

Direct Drive Z stage

A linear motion stage is used to move the probe in a perpendicular motion to the sample. Probe/sample angle alignment is not required, facilitating a much faster probe approach.

Small Footprint

The stage dimensions of 4" X 7"" require little space and fit easily on a tabletop.

Precision XY Stage with Micrometer

The sample is moved relative to the probe with a precision xy micrometer stage. Thus, the sample can be moved without touching it.

Modes Electric Plug

A six pole electrical plug is located at the back of the stage to expand the capabilities of the TT-2 AFM.

XYZ Precision Piezo Scanner

The modified tripod design utilizes temperature compensated strain gauges which assure accurate measurements from images. Also, with this design it is possible to rapidly zoom into a feature visualized in an image.

Laser/Detector Alignment

Both the light lever laser and the photo detector adjustment mechanism may be directly viewed. This feature simplifies the laser/detector alignment.

Adaptable Sample Holder

At the top of the XYZ scanner is a removable cap that holds the sample. The cap can be modified - or a new cap can be designed – to hold many types of samples.

TT 2AFM Stage 1 pm rev

TT-2 AFM EBOX

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as xy scanning, are optimized with a 24 bit digital to analog converter. With the analog z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

24 bit scan DAC

Scanning waveforms for generating precision motion in the X-Y axis with the piezo scanners are created with 24 bit DACS driven by a 32 bit micro controller. With 24 bit scanning, the highest resolution AFM images may be measured. Feedback control using the xy strain gauges assures accurate tracking of the probe over the surface.

Phase and Amplitude Detector Circuit

Phase and amplitude in the Ebox are measured with highly stable phase and amplitude chips. The system can be configured to feed back on either phase or amplitude when scanning in vibrating mode.

Signal Accessible

At the rear of the eBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the eBox.

Status Lights

At the front of the Ebox is a light panel that has 7 lights. In the unlikely event of a circuit failure, these lights are used for determining the status of the Ebox power supplies.

Precision Analog Feedback

Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.

Variable Gain High Voltage Piezo Drivers

An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.

TT-AFM Ebox diagram

TT-2 AFM Software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

Prescan Window

Pre-scan Window

A pre-scan window includes all of the functions that are required before a scan is started. The functions are presented in a logical sequence on the screen.

 

Scan Window

Scan Window

Once all of the steps in the pre-scan window are completed, the scan window is used for measuring images. Scan parameter, Z feedback parameters, and image view functions may be changed with dialogs on this screen.

 

LabVIEW programming window

LabVIEW Window

Industry standard programming environment. Readily customized and modified for specialized applications. Instrumentation already using LabVIEW can be added to the TT-2 AFM to create new capabilities.

 

 

Image Analysis Software

Included with the TT-2 AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze and display SPM images.

Image Analysis Software

  • visualization: false color representation with different types of mapping
  • shaded, logarithmic, gradient- and edge-detected, local contrast representation, Canny lines
  • openGL 3D data display: false color or material representation
  • easily editable color maps and OpenGL materials
  • basic operations: rotation, flipping, inversion, data arithmetic, crop, resampling
  • leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
  • value reading, distance and angle measurement
  • profiles: profile extraction, measuring distances in profile graph, profile export
  • filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, checker pattern removal
  • general convolution filter with user-defined kernel
  • statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, facet orientation analysis
  • statistical quantities calculated from area under arbitrary mask
  • row/column statistical quantities plots
  • ISO roughness parameter evaluation
  • grains: threshold marking and un-marking, watershed marking
  • grain statistics: overall and distributions of size, height, area, volume, boundary length, bounding dimensions
  • integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), wavelet anisotropy detection
  • fractal dimension analysis
  • data correction: spot remove, outlier marking, scar marking, several line correction methods (median, modus)
  • removal of data under arbitrary mask using Laplace or fractal interpolation
  • automatic xy plane rotation correction
  • arbitrary polynomial deformation on xy plane
  • 1D and 2D FFT filtering
  • fast scan axis drift correction
  • mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, shrinking
  • simple graph function fitting, critical dimension determination
  • force-distance curve fitting
  • axes scale calibration
  • merging and immersion of images
  • tip modeling, blind estimation, dilation and erosion

TT-2 AFM Video Microscope

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 3 mega pixel camera, light source, microscope stand, and Windows software for displaying images.

TT-AFM Video Optical Microscope shows test structureHere the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

TT-AFM Video Microscope on HOPGThe video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

 

TT-AFM laser alignment through video microscope

Laser alignment is greatly facilitated with the video optical microscope. This non-vibrating cantilever is 250 µm long. The red spot is from the laser reflecting off the cantilever.

 

 

TT-2 AFM Probe Holder / Exchange Tool

The TT-2 AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. With the probe exchange tool, changing probes takes only a few minutes.

ls afm prob

 

Quick and Easy AFM Probe Exchange

probe holder insert pmThe probe holder insert is removed from the TT-2 AFM
probe exchange pmR to L: box of probes, probe exchange tool, probe holder insert
 
activating AFM probe spring clipActivating the probe spring clip by applying light pressure
 

AFM Workshop Image Gallery

DNA; 1 µm x 1 µm AFM image DNA; 1 µm x 1 µm AFM image DNA; 1.5 µm x 1.5 µm DNA; 1.5 µm x 1.5 µm DNA; 1.5 µm x 1.5 µm AFM image DNA; 1.5 µm x 1.5 µm AFM image DNA 2 µm x 2 µm, on multiple mica layers DNA 2 µm x 2 µm, on multiple mica layers
Marks made with AFM Lithography 20 um x 20 µm Marks made with AFM Lithography 20 um x 20 µm Nanolithography, 25 µm x 25 µm image Nanolithography, 25 µm x 25 µm image 1 nm and 3 nm particles test sample. 500 nm x 500 nm 1 nm and 3 nm particles test sample. 500 nm x 500 nm 1 nm and 3 nm particles test sample 100 nm x 100 nm 1 nm and 3 nm particles test sample 100 nm x 100 nm
 HOPG, 4 µm x 4 µm HOPG, 4 µm x 4 µm Ruled Grating Irregularities, 3-D image Ruled Grating Irregularities, 3-D image Ruled Grating Irregularities, ruled diffraction grating Ruled Grating Irregularities, ruled diffraction grating Multiphase Polymer Film, 3D, phase signal overlaid Multiphase Polymer Film, 3D, phase signal overlaid
Defects on 0.3 nm Si Terraces, 4 µm x4 µm Defects on 0.3 nm Si Terraces, 4 µm x4 µm 3 µm x 3 µm image of 173 nm latex spheres 3 µm x 3 µm image of 173 nm latex spheres Latex spheres; 3 µm x 3 µm; 173 nm spheres Latex spheres; 3 µm x 3 µm; 173 nm spheres Aluminum foil, 3D image; 50 µm x 50 µm Aluminum foil, 3D image; 50 µm x 50 µm
SiC Terraces, 6 µm x 6 µm AFM image SiC Terraces, 6 µm x 6 µm AFM image Aluminum foil, dull side, 3-D image; 50 µm x 50 µm. Aluminum foil, dull side, 3-D image; 50 µm x 50 µm. Self-assembled lipid nanotubes; 20 µm x 20 µm. Self-assembled lipid nanotubes; 20 µm x 20 µm. Self-assembled lipid nanotubes, 5 µm x 5 µm Self-assembled lipid nanotubes, 5 µm x 5 µm
Red blood cells, 30 µm x 30 µm 2D red color scale Red blood cells, 30 µm x 30 µm 2D red color scale Red blood cells 3-D AFM image Red blood cells 3-D AFM image Polymer used in glue, 2D light shaded view Polymer used in glue, 2D light shaded view MFM image of magnetic disk; 40 µm x 40 µm MFM image of magnetic disk; 40 µm x 40 µm
Polymer used in glue 10 µm x 10 µm 3D color scale Polymer used in glue 10 µm x 10 µm 3D color scale 20 µm X 20 µm AFM image of SHS 100 nm test pattern 20 µm X 20 µm AFM image of SHS 100 nm test pattern Inverted Optical microscope image of Caco-2 cells Inverted Optical microscope image of Caco-2 cells AFM scan of Caco-2 cells; 48 µm x 48 µm. AFM scan of Caco-2 cells; 48 µm x 48 µm.
Inverted optical Image of neutraphil a1 cells Inverted optical Image of neutraphil a1 cells Neutrophil & erythrocyte cells; 50 µm light shaded Neutrophil & erythrocyte cells; 50 µm light shaded Caco-2 cells. Left: Epiflourescence. Right: AFM Caco-2 cells. Left: Epiflourescence. Right: AFM Tip checker sample, 2-D color scale Tip checker sample, 2-D color scale
Tip checker sample, 3-D color scale view. Tip checker sample, 3-D color scale view. Silicon test pattern 40 µm x 40 µm grey scale image Silicon test pattern 40 µm x 40 µm grey scale image Holes in polymer film, 10 µm x 10 µm AFM Image Holes in polymer film, 10 µm x 10 µm AFM Image Silicon test pattern, 7 µm x 7 µm zoomed in image Silicon test pattern, 7 µm x 7 µm zoomed in image
Patterns on ferroelectric material 50 µm x 50 µm Patterns on ferroelectric material 50 µm x 50 µm Multiphase polymer height image Multiphase polymer height image Multiphase polymer 10 µm x 10 µm, phase image. Multiphase polymer 10 µm x 10 µm, phase image. Light shaded image of cell, 7 µm x 7 µm AFM Image Light shaded image of cell, 7 µm x 7 µm AFM Image
Vibrating mode showing three species of bacteria Vibrating mode showing three species of bacteria Bacteria, phase mode image Bacteria, phase mode image Amplitude Image of Leishmania 25 µm x 25 µm Amplitude Image of Leishmania 25 µm x 25 µm Scratch mark in metal 10 µm x 10 µm color scale Scratch mark in metal 10 µm x 10 µm color scale
Bacteria spore mutants 30 µm x 30 µm AFM image Bacteria spore mutants 30 µm x 30 µm AFM image Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image Tobacco Mosaic Virus 1.2 µm x 1.2 µm color scale Tobacco Mosaic Virus 1.2 µm x 1.2 µm color scale
Conductive AFM scan, standard reference sample Conductive AFM scan, standard reference sample Atomic terraces on metal surface, 5 µm x 5 µm Atomic terraces on metal surface, 5 µm x 5 µm 0.3 nm terraces on Si, 5 µm x 5 µm color scale image 0.3 nm terraces on Si, 5 µm x 5 µm color scale image 0.3 nm terraces on Si 10 µm x 10 µm error signal image. 0.3 nm terraces on Si 10 µm x 10 µm error signal image.
Gold nanoparticles 2D color scale 14 nm diameter Gold nanoparticles 2D color scale 14 nm diameter Gold nanoparticles 3D color scale 14 nm diameter Gold nanoparticles 3D color scale 14 nm diameter Phase mode of PMMA 300 nm x 300 nm Phase mode of PMMA 300 nm x 300 nm DVD: 6 µm x 6 µm AFM image DVD: 6 µm x 6 µm AFM image
Small scan of microterraces on previous image Small scan of microterraces on previous image STEPP: smaller scale zoom to view microterraces STEPP: smaller scale zoom to view microterraces Epithelial Cell 35 µm x 35 µm, 3D AFM image Epithelial Cell 35 µm x 35 µm, 3D AFM image Epithelial cell in liquid, 32 µm x 32 µm AFM image Epithelial cell in liquid, 32 µm x 32 µm AFM image
STEPP: 16 µm x 16 µm, showing microterraces STEPP: 16 µm x 16 µm, showing microterraces Cardiomyocytes; inverted optical miroscope image Cardiomyocytes; inverted optical miroscope image Cardiomyocytes; LS-AFM inverted optical microscope Cardiomyocytes; LS-AFM inverted optical microscope Polystyrene Nanoparticles: Binodal distribution Polystyrene Nanoparticles: Binodal distribution
BOPP polymer film; 2 µm x 2 µm. BOPP polymer film; 2 µm x 2 µm. E. coli cell, displaying fimbriae & polar flagellum E. coli cell, displaying fimbriae & polar flagellum Gold Nanoparticles, 100 nm Gold Nanoparticles, 100 nm Gold Nanoparticles, 20 nm AFM Image Gold Nanoparticles, 20 nm AFM Image
Mutant bacteria spores; 30 µm x 30 µm. Mutant bacteria spores; 30 µm x 30 µm. Donut shaped particles 2.5 µm x 2.5 µm Donut shaped particles 2.5 µm x 2.5 µm Gold nanotriangles Gold nanotriangles Patterned wafer after CMP; 50 µm x 50 µm Patterned wafer after CMP; 50 µm x 50 µm
Polished surface, 3D AFM image; 30 µm x 30 µm Polished surface, 3D AFM image; 30 µm x 30 µm Three component polymer phase image; 5µm x 5µm Three component polymer phase image; 5µm x 5µm Oriented polypropylene showing network of fibers Oriented polypropylene showing network of fibers Thermoplastics and rubbers blend. Phase image. Thermoplastics and rubbers blend. Phase image.
SEBS polymer; phase image 1 µm x 1 µm. SEBS polymer; phase image 1 µm x 1 µm. SEBS polymer, AFM topography, 1 µm x 1 µm. SEBS polymer, AFM topography, 1 µm x 1 µm. SEBS polymer, phase image. 500 nm x 500 nm SEBS polymer, phase image. 500 nm x 500 nm Quantum dots, 3D AFM image, 1.5µm x 1.5 µm Quantum dots, 3D AFM image, 1.5µm x 1.5 µm
Polymer, AFM phase image; 19 µm x 19 µm. Polymer, AFM phase image; 19 µm x 19 µm. Polymer, AFM topography image; 19 µm x 19 µm. Polymer, AFM topography image; 19 µm x 19 µm. Calibration reference - 40 µm x 40 µm x 1 µm Calibration reference - 40 µm x 40 µm x 1 µm Silicon wafer, AFM scan; 10 µm x 10 µm. Silicon wafer, AFM scan; 10 µm x 10 µm.
Silicon wafer, 3D AFM scan; 10 µm x 10 µm. Silicon wafer, 3D AFM scan; 10 µm x 10 µm. Patterned wafer polished by CMP Patterned wafer polished by CMP Patterned wafer polished by CMP, 10 µm x 10 µm Patterned wafer polished by CMP, 10 µm x 10 µm Nanoparticles, 3 µm x 3 µm Nanoparticles, 3 µm x 3 µm
Graphene sample, AFM image 11 µm x 11 µm Graphene sample, AFM image 11 µm x 11 µm  

TT-2 AFM Modes

Standard with every TT-2 AFM are non-vibrating (NV) mode and vibrating (V) modes for making topography scans. Additional modes included with the product are lateral force imaging as well as phase mode imaging. All of the scanning modes that can be implemented with a light lever AFM are also possible with the TT-2 AFM.

With the window below, the resonance frequency of a cantilever is readily measured. Additionally, the phase characteristics of the probe-sample interaction are captured.

AFM cantilever resonance frequency shown in software

 

 

Optional Modes

Conductive AFM

MFM

Lithography

Advanced F/D

TT-2 AFM Options



TT-2 AFM with acoustic enclosure

Assembly Workshop

Attendees build and learn to operate their TT-2 AFM, along with receiving training on the theory, operation and applications of an atomic force microscope.

High Resolution Scanner

Allows a range of 15 X 15 microns in XY and 7 microns in Z.

Acoustic Enclosure

Reduces unwanted acoustic and structural vibrations.

Dunk and Scan Probe Holder

Open liquid cell for scanning samples submerged in liquids. Can directly replae the TT-2 AFM probe holder of the NP/SA/ or LS-AFM probe holder

Environmental Cell

Permits scanning in inert environments or liquids.

AFM Curriculum: Laboratory Based

All-inclusive curriculum introduces undergraduate students to atomic force microscopy. Includes Student Manual, Teacher Manual, four samples, and eight probes.

Conductive AFM

Measures the 2-D conductivity of sample surfaces.

Magnetic Force Microscopy

Measures the surface magnetic field of a sample by incorporating a magnetic probe into the AFM.

Lithography

Uses an AFM probe to alter the physical or chemical property of a sample surface.

Advanced Force Distance Curves

Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters such as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.

AFMWorkshop regularly develops new Options. Contact AFMWorkshop for more information on options for the TT-2 AFM.



 



TT-2 AFM Advanced Configuration

TT-2 AFM ADVANCED CONFIGURATION

The TT-2 AFM Advanced Configuration provides all of the advanced features required for demanding projects.

Included with the package is

TT-2 AFM

50 Micron and 15 Micron scanner

Motorized Focus

Advanced Force Distance

Image Logger

Acoustic Cabinet

Documentation Package with all schematics, mechanical drasings, and software protocols

Break out box

The benefit of purchasing this package includes a substantial package discounted price, as well as ensuring that you are ready for any demanding project as soon as your AFM is delivered to your lab.

TT-2 AFM Specifications


50 Micron XYZ Scanner
Type Modified Tripod
xy Linearity < 1%
xy Range > 50 µm
xy Resolution < 3 nm closed loop
< 1 nm open loop
xy Actuator type Piezo
xy Sensor type Strain Gauge
z Range > 16 µm
z Linearity < 5 %
Z sensor noise < 1 nm
Z feedback noise < 0.15 nm*
Z Actuator Type Piezo
Z Sensor type Strain Gauge


15 Micron XYZ Scanner
Type Modified tripod
XY Linearity < 1%
XY Range > 15 µm
XY resolution < 3 nm closed loop
< 0.3 nm open loop
XY Actuator type Piezo
Sensor type Strain Gauge
Z Range > 7 µm
Z Linearity < 5 %
Z sensor noise < 5 nm
Z feedback noise < 0.08 nm*
Z Actuator Type Piezo
Z Sensor type None

Sample Holder
Type Magnet
Max Lateral Dimensions 1"
Max. Height 0.75"

Light Lever AFM Force Sensor
Probe Types Industry standard
Probe insertion Manual – probe
exchange tool
Probe holding mechanism Clip
Vibrating mode piezo
Electrical connector to probe
Laser/Detector adjustment range +/- 1.5 mm
Adjustment resolution 1 µm
Minimum Probe to Objective 25 mm
Laser Type 670 nm diode, < 1 mw
Detector  
Type 4 quadrant
Band Width > 500 kHz
Signals Transmitted TL, BL, TR, BR
Gain Lo, High Settings
Probe sample angle 10°

Video Microscope

 
Minimum Zoom
Maximum Zoom
 
Field of view
2 x 2 mm
300 x 300 µm
 
Resolution
20 µm
2 µm
 
Working Distance
114 mm
114 mm
 
Magnification
45X
400X
 


Computer

Industry Standard Computer and Monitor, laptop available upon request.

Windows

AFMWorkshop LabVIEW.exe installed

 
XY Translator
Range 25.4 mm
Resolution 2 µm
Type Bearing - spring loaded
Lock Down Yes


Z Motion
Type Direct Drive
Range 25 mm
Drive Type Stepper Motor
Min. Step Size 330 nm
Slew Rate 8 mm/minute
Limit Switch Top, Bottom
Control Software – rate, step size


Digital Data Input Output
Connection USB
Scanning DAC  
Number 2
Bits 24
Frequency 7 kHz
Control DAC  
Number 2
Bits 14
Frequency 2 kHz
ADC  
Number 8
Bits 14
Frequency 48 kHz


Analog Electronics
Vibrating Mode  
Freq Range 2 kHz – 800 kHz
Output Voltage 10 Vpp
Z Feedback  
Type PID
Sample Hold Yes
Voltage 0-150 V
XY Scan  
Voltage 0 – 150 V
Bandwidth > 200 Hz
Pan & Zoom 22 Bits
Tip Approach Cutoff > 20 µm sec.


Software
Environment LabVIEW
Operating System Windows
Image Acquisition Real Time Display
(2 of 8 channels)
Control Parameters  
PID Yes
Setpoint Yes
Range Yes
Scan Rate Yes
Image Rotate 0 and 90 degrees
Laser Align Yes
Vibrating Freq. Display Yes
Force Distance Yes
Tip Approach Yes
Oscilloscope Yes
Image Store Format Industry Standard
Image Pixels 16 X 16 to 1024 X 1024
H.V. Gain Control XY and Z
Real time display Line Level, Light Shaded,
Grey Color Pallet
Calibration System Window
Probe Center Yes

 

* Z Noise performance depends greatly on the environment the TT-2 AFM is used in. Best Z noise performance is obtained in a vibration free environment.

** Every effort is made to present accurate specifications, however, due to circumstances beyond AFMWorkshop's control specifications are subject to change. All specifications are accurate to +/-5%.