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Non-Vibrating AFM Probe

SHOCONA

Applied NanoStructures' SHOCONA probes are silicon probes designed for contact mode applications. These probes feature shorter cantilevers, which provide better sensitivity without compromising on spring constant requirements. Our SHOCONA probes have Aluminum coating on the reflex side to increase laser signal quality.

Tip Specifications

Material: Silicon
Shape: Pyramidal
Height (μm): 14-16
Aspect Ratio: 1.5-3.0
ROC* (μm): 6
Coating: None
*Nominal specification; guaranteed < 10nm

Cantilever Specifications

Material: Silicon
Shape: Rectangular
Reflex Coating: Al, 30 nm ± 5


Parameter Nominal Value Minimum Value Maximum Value
Spring Constant (N/m) 0.10 0.02 0.18
Frequency (kHz) 28 18 38
Length (μm) 225 215 235
Width (μm) 43 37 47
Thickness (μm) 1.0 1.5 0.5