The Smart Choice in AFMs for NanoTechnology Research
Atomic force microscopes are essential for nanotechnology research requiring the visualization and measurement of nanostructures. AFMWorkshop's innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Our instruments are robust and can be used in single-user as well as multi-user laboratories. AFMWorkshop's microscopes share a powerful and intuitive user interface that meet the needs of casual as well as advanced AFM operators.
Our Atomic Force Microscopes:
- give great images of nanostructures on both soft and hard materials;
- have an open architecture to facilitate the development of novel instruments;
- are used by customers to create images used in publications;
- include the most common modes.
Throughout the world, AFMWorkshop products are used everyday for nanotechnology research projects in both life and physical sciences. While AFMWorkshop products were introduced to the market in late 2010, we already have a growing list of publications by successful AFMWorkshop customers. (It typically takes several years for customers to produce publications based on research generated by a new AFM.) To view a list of publications referencing AFMWorkshop products, click here.
All types of samples are scanned with AFMWorkshop atomic force microscopes. Below are examples of nanostructures, patterned surfaces, materials, and life science samples. Many more AFM images from AFMWorkshop atomic force microscopes can be viewed in our AFM Image Gallery.
At the left is a 500 nm X 500 nm vibrating mode image of 1 nm and 3 nm nanoparticles measured with a 50 x 50 x 15 µm scanner. At the right is a 20µm x 20µm image of self assembled lipid nanotubes.
On the left is a 40 X 40 µm non-vibrating mode image of a gear fabricated by MEMS. On the right is a 50 x 50 µm image of structures on a patterned wafter after CMP.
On the left is a 2 x 2 µm image of BOPP fibers measured in ambient air. On the right is a 10 x 10 µm image of 0.3 nm terraces on Si. At the bottom of the Si image, a 50 nm major step in the sample's surface is visible. Note the small terraces at the edge of the larger terrace.
These two images illustrate the power of the TT-AFM for life sciences scanning. At the left is a 6 x 4 µm phase mode image of an Ecoli cell. At the right is a 3 x 3 µm image of DNA deposited on the surface of mica, imaged with vibrating mode in ambient air.
AFMWorkshop's TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes already dedicated to specialized experiments. Routine and repetitive scanning of not particularly challenging samples can be completed without losing valuable time to readjusting the dedicated and more expensive instruments. Additionally, students and researchers can prepare themselves for operating higher-end microscopes by first learning to operate and master the TT-AFM.
Advanced Features of AFMWorkshop AFM Products
High Resolution Scanning With a Z noise floor of 0.08 nm, the TT-AFM is capable of high resolution scanning on samples such as DNA, nanoparticles and nanotubes. To ensure optimal performance, our technical staff can provide pre-sales evaluation of your proposed AFM installation location.
Expandable architecture Our product line is expandable with many features offered as upgrades that can be purchased after your initial purchase. We uniquely offer several stage options that may be purchased for the same SPM Control Station.
Modes Our products are offered with standard modes such as vibrating, and non-vibrating topography modes as well as phase mode and LFM. Additional modes such as C-AFM, lithography, MFM, and F/D are available as options for all of our products.
Recommended Products for Nanotechnology Research
TT-AFM ‒ Nano Materials Research
LS-AFM ‒ Life Sciences Research