Atomic Force Microscope Modes and Accessories

MODELIMAGEDESCRIPTIONPRICEDETAILS
CA-2011 Conductive AFM Conductive AFM (C-AFM)
An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.
$4,995.00 CS-3230
MFM-01 Magnetic Mode Magnetic Force Microscopy (MFM)
Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.
$4,995.00 satya
LITHO Lithography Lithography
This Lithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI's are available to customers who want to modify the software and create new capabilities.
$995.00 satya
ADV-FD Force Advanced Force/Distance
Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.
$995.00 satya

 

Accessories

MODELIMAGEDESCRIPTIONPRICEDETAILS
PS-2010 50 micron scanner 50 Micron AFM Scanner
Samples are held in place on this scanner with a removable cap. This modified tripod scanner utilizes low voltage piezoelectric ceramics and temperature compensated strain gauges. Connections to the scanner are made with a 20-pin ribbon cable.
$3,780.00 satya
PS-2011 15 micron afm scanner 15 Micron AFM Scanner
The 15 micron scanner is interchangeable with the 50 micron scanner in the TT-AFM. Extremely high resolution scans are made with the 15 micron scanner.
$3,780.00 satya
TS-Z6 7 micron Z Piezoelectric probe holder 7 Micron Z Piezoelectric Ceramic/Probe Holder

An independent Z piezoelectric ceramic/probe holder module for the SA-AFM and NP-AFM. Designed for making low noise
measurements.With a Z range of 7 μm and specified noise floor of 0.12 nm, it is ideal for nano-roughness measurements.

 $2,995 more about 7 micron scanner 
TS-Z16  TS Z16 with Strain Gauge 16 Micron Z Piezoelectric Ceramic/Probe Holder with Strain Gauge

For the LS, NP and SA-AFM. Z piezoelectric/probe holder with strain gauge. Designed for general AFM applications, and for applications requiring force distance curves.

 $5,995 about 16 micron Z 
LI-2010 Environmental Cell Environmental Cell
Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with the TT-AFM probe holder while scanning.
$3,491.00 satya
DS-TTAFM Dunk and Scan Dunk and Scan Liquid Cell and Probe Holder for TT-AFM
A probe holder and open liquid cell for scanning samples submerged in liquids.  The Dunk and Scan can directly replace the TT-AFM probe holder.
$3,491.00 satya
DS-NPSA DS-NPSA Dunk and Scan Liquid Cell and Probe Holder for NP/SA/LS-AFM
A probe holder and open liquid cell for scanning samples submerged in liquids.  The Dunk and Scan can directly replace the the NP/SA/or LS-AFM probe holder.
$6,250.00 satya
MF-4456 AFM Focus Assist thumb Focus Assist for TT-2 AFM
The focus assist option replaces the manual optical microscope support on the TT-AFM. This option includes video optics, control electronics and control software.
Call satya
IL-3478 Image Logger 01 System Image Logger for TT-2 AFM
The Image Logger for the TT2-AFM features the ability to view forward and reverse images for six channels, display real time oscilloscope-data logger for 6 channels and visualize the spectrum of the 6 data channels.
Call satya
  Accessory List Curriculum Book Cover Small AFM Curriculum (manuals, samples, probes included)
All-inclusive curriculum introduces undergraduate students to the technology and instrumentation of atomic force microscopy. Includes Student Manual, Teacher Manual, four samples reviewed in the manual, and eight probes of differing spring constants for use with profiled samples. 
$995.00 CS-3230
VI-2011   Vibration Solutions
Reduces structural and acoustic vibrations that create unwanted noise in AFM images. Solutions include Acoustic Cabinet, Bungee, Active and Passive Vibration Tables, and Custom solutions. Recommended for making extremely high resolution images.
$2,785.00 CS-3230
DO-2010 Documentation Package Documentation Package for TT-AFM
All mechanical drawings, electronic schematics, and software interface protocols are included. Available for TT-AFM customers only.  Additional information and alternate formats also available upon request.
$595.00 CS-3230
DO-2012 Documentation Package Documentation Package for NP/SA/LS-AFM
All mechanical drawings, electronic schematics, and software interface protocols are included. Available for NP / SA/ LS-AFM customers only.  Additional information and alternate formats also available upon request.
$595.00 CS-3230
CS-3230 E-Box Ebox
Includes all of the electronics required to drive an AFM stage, including a Z stepper motor, LL-AFM force sensor and an xyz piezo scanner. To access the functions of the electronic board, LabVIEW applications software is also included.
$14,049.00 CS-3230
MS-3230 TT-AFM stage TT-AFM Stage
Includes a stepper-motor-driven Z stage, LL-AFM force sensor, and precision X-Y stage. The stage does not include a piezo scanner or video optical microscope. Electrical connections are made at  the back of the stage with a 60-pin ribbon cable connector.
$14,521.00 satya