TT-2 AFM

Table Top Atomic Force Microscope
For demanding applications

This compact, second generation high resolution tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Price Range*
$33,980.00 -
$91,920.00
* Prices vary depending on options purchased, importation taxes, and installation - training fees.

Click to Submit Inquiries or Questions

TT-2 AFM Details

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Overview
Stage
EBOX
Software
Video Microscope
Probe Holder
Gallery
Modes
Options
Specifications
TT-2 AFM Overview
Sample Sizes: Up to 1" X 1" X 3/4"
Standard Scanning Modes: Vibrating(Tapping), Non Vibrating (Contact), Phase, LFM
Scanners: 100 X 100 X 17 um, 50 X 50 X17 um, 15 X 15 X 7 um
Video Optical Microscope: Zoom to 400X, 2 µm resolution
Stage and EBox Size: Compact table top design
Download: TT-2 AFM Product Datasheet PDF
3-D Model of TT-2 AFM PDF

Key Features and Benifits of the TT-2 AFM

Low Noise Floor With a noise floor <80 picometers, the TT-2 AFM is capable of measureing samples with features from nanometers to microns.
Direct Drive Tip Approach A linear motion stage moves the probe relative to the sample, The probe sample angle does not change, and samples of many thicknesses are readily scanned.
Research Grade Video Optical Microscope With a mechanical 7:1 zoom and a resolution of 2 microns the video optical microscope facilitates locating features, tip approach, and laser alighnment.
Multiple Scanners Linearized piezoelectric scanners with several ranges are availble to optimize scanning conditions.
LabView Software The TT-2 uses industry standard labview software. For customization, the systems VI's are readily available.
Modular Design Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithograpy, liquid scanning when you are ready.
Simple Probe Exchange With the removable probe holder, exchanging probes is simple, and takes less than a minute.
Ligh Lever Large adjustment range Becasue the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications

Research With over 200 TT-2 AFM's in laboratories throughout the world researchers have published 100's of publications in all types of science and engineering journals. Read More
Instrument Innovators  The TT-2 AFM serves as an ideal plaform for createing new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
Education  Wtih its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications and operation.Read More

 

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for industry, research and education can be found by clicking on any of the links below:
Photonics Applications
Polymer Applications
Nanoparticle Applications
Life Sciences Applications
Process Development and Process Control Applications
Education Applications

TT-2 AFM Videos

A 40 minute recording of a live stream TT-2 AFM demonstration is available here, along with a series of brief, two-minute introductory videos of the TT-2 AFM and its components here.



TT-2 AFM Stage

The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

Rigid Frame Design: The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.
Light Lever AFM Force Sensor: Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.
Integrated Probe Holder/Probe Exchanger: A unique probe holder and clipping mechanism allows quick and easy probe exchange.
Direct Drive Z stage: A linear motion stage is used to move the probe in a perpendicular motion to the sample. Probe/sample angle alignment is not required, facilitating a much faster probe approach.
Small Footprint: The stage dimensions of 4" X 7"" require little space and fit easily on a tabletop.
Precision XY Stage with Micrometer: The sample is moved relative to the probe with a precision xy micrometer stage. Thus, the sample can be moved without touching it.
Modes Electric Plug: A six pole electrical plug is located at the back of the stage to expand the capabilities of the TT-2 AFM.
XYZ Precision Piezo Scanner: The modified tripod design utilizes temperature compensated strain gauges which assure accurate measurements from images. Also, with this design it is possible to rapidly zoom into a feature visualized in an image.
Laser/Detector Alignment: Both the light lever laser and the photo detector adjustment mechanism may be directly viewed. This feature simplifies the laser/detector alignment.
Adaptable Sample Holder: At the top of the XYZ scanner is a removable cap that holds the sample. The cap can be modified - or a new cap can be designed – to hold many types of samples.
TT 2AFM Stage 1 pm rev
TT-2 AFM EBox

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as xy scanning, are optimized with a 24 bit digital to analog converter. With the analog z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

28 Bit Scanning: Scanning waveforms for generating motion in the X-Y axis with the piezo scanners are created with 24 bit DACS and HV amplifiers with 4 bits of gain control, giving 28 bits scanning. Feedback control using the XY strain gauges assures accurate tracking of the probe over the surface.
Phase and Amplitude Detector Circuit: Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can be configured to feed back on either phase or amplitude when scanning in vibrating mode.
Signal Accessible: At the rear of the EBox is a 50 pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.
Status Lights: At the front of the EBox is a light panel that has 7 lights. In the unlikely event of a circuit failure, these lights are used for determining the status of the EBox power supplies.
Precision Analog Feedback: Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.
Variable Gain High Voltage Piezo Drivers: An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers.
TT-AFM Ebox diagram
TT-2 AFM Software

Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also enables the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

Prescan Window

Pre-scan Window

A pre-scan window includes all of the functions that are required before a scan is started. The functions are presented in a logical sequence on the screen.

 

Scan Window

Scan Window

Once all of the steps in the pre-scan window are completed, the scan window is used for measuring images. Scan parameter, Z feedback parameters, and image view functions may be changed with dialogs on this screen.

 

LabVIEW programming window

LabVIEW Window

Industry standard programming environment. Readily customized and modified for specialized applications. Instrumentation already using LabVIEW can be added to the TT-2 AFM to create new capabilities.

 

 

Image Analysis Software

Included with the TT-2 AFM is the Gwyddion open source SPM image analysis software. This complete image analysis package has all the software functions necessary to process, analyze and display SPM images.

Image Analysis Software

  • visualization: false color representation with different types of mapping
  • shaded, logarithmic, gradient- and edge-detected, local contrast representation, Canny lines
  • openGL 3D data display: false color or material representation
  • easily editable color maps and OpenGL materials
  • basic operations: rotation, flipping, inversion, data arithmetic, crop, resampling
  • leveling: plane leveling, profiles leveling, three-point leveling, facet leveling, polynomial background removal, leveling along user-defined lines
  • value reading, distance and angle measurement
  • profiles: profile extraction, measuring distances in profile graph, profile export
  • filtering: mean, median, conservative denoise, Kuwahara, minimum, maximum, checker pattern removal
  • general convolution filter with user-defined kernel
  • statistical functions: Ra, RMS, projected and surface area, inclination, histograms, 1D and 2D correlation functions, PSDF, 1D and 2D angular distributions, Minkowski functionals, facet orientation analysis
  • statistical quantities calculated from area under arbitrary mask
  • row/column statistical quantities plots
  • ISO roughness parameter evaluation
  • grains: threshold marking and un-marking, watershed marking
  • grain statistics: overall and distributions of size, height, area, volume, boundary length, bounding dimensions
  • integral transforms: 2D FFT, 2D continuous wavelet transform (CWT), 2D discrete wavelet transform (DWT), wavelet anisotropy detection
  • fractal dimension analysis
  • data correction: spot remove, outlier marking, scar marking, several line correction methods (median, modus)
  • removal of data under arbitrary mask using Laplace or fractal interpolation
  • automatic xy plane rotation correction
  • arbitrary polynomial deformation on xy plane
  • 1D and 2D FFT filtering
  • fast scan axis drift correction
  • mask editing: adding, removing or intersecting with rectangles and ellipses, inversion, extraction, expansion, shrinking
  • simple graph function fitting, critical dimension determination
  • force-distance curve fitting
  • axes scale calibration
  • merging and immersion of images
  • tip modeling, blind estimation, dilation and erosion
TT-2 AFM Video Microscope

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 3 camera, light source, microscope stand, and Windows software for displaying images.

TT-AFM Video Optical Microscope shows test structureHere the video optical microscope allows viewing features on a test structure. The AFM cantilever is on the right. Three images show results of areas selected for AFM scanning.

TT-AFM Video Microscope on HOPGThe video optical microscope zooms in to show an HOPG sample surface and the AFM cantilever.

7 to 1 Mechanical Zoom

TT-AFM laser alignment through video microscope

TT-AFM laser alignment through video microscope

With a 7:1 mehanical zoom, it is possible to use a large field of view to locate features for imaging, then it is possible to zoom in to get very high resolution video microscope images

 
TT-2 AFM Probe Holder

The TT-2 AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. With the probe exchange tool, changing probes takes only a few minutes.

 

Quick and Easy AFM Probe Exchange

probe holder insert pmThe probe holder insert is removed from the TT-2 AFM

 

 

probe exchange pmR to L: box of probes, probe exchange tool, probe holder insert
 

 

 

activating AFM probe spring clipActivating the probe spring clip by applying light pressure
 

 

 

 

 

TT-2 AFM Image Gallery

Marks made with AFM Lithography 20 um x 20 µm

Marks made with AFM Lithography; 20 µm x 20 µm

1 nm and 3 nm particles test sample. 500 nm x 500 nm

1 nm and 3 nm particles test sample. 500 nm x 500 nm AFM image

Nanolithography, 25 µm x 25 µm image

Nanolithography, Changing Probe Force. 25 µm x 25 µm image of lines made in PMMA surface. Each line is 1 µm apart; each has differing probe force.

1 nm and 3 nm particles test sample 100 nm x 100 nm

1 nm and 3 nm particles, test sample. 100 nm x 100 nm

Highly Oriented Pyrolitic Graphite 5 µm x 5 µm

Highly Oriented Pyrolitic Graphite, HOPG 5 µm x 5 µm, showing atomic steps

Latex spheres; 3 µm x 3 µm; 173 nm spheres

Latex spheres; 3 µm x 3 µm; 173 nm latex spheres AFM Image

Ruled Grating Irregularities, 3-D image

Ruled Grating Irregularities, 3-D image, 4 µm x 4 µm

Multiphase Polymer Film, 3D, phase signal overlaid

Multiphase Polymer Film - 3D shape from topography with phase signal overlaid as color

Defects on 0.3 nm Si Terraces, 4 µm x4 µm

AFM image of defects on 0.3 nm Si Terraces, 4 µm x 4 µm

3 µm x 3 µm image of 173 nm latex spheres

Latex spheres; 3 µm x 3 µm image of 173 nm latex spheres

AFM Workshop Image DNA 3um r1 pm

AFM Workshop Image DNA 3um r1 pm

Aluminum foil, 3D image; 50 µm x 50 µm

Aluminum foil, 3D AFM image; 50 µm x 50 µm.

SiC Terraces, 6 µm x 6 µm AFM image

SiC Terraces; 6 µm x 6 µm, AFM image

Aluminum foil, dull side, 3-D image; 50 µm x 50 µm.

Aluminum foil, dull side, 3D image; 50 µm x 50 µm.

Self-assembled lipid nanotubes; 20 µm x 20 µm.

Self-assembled lipid nanotubes; 20 µm x 20 µm, AFM image.

Red blood cells, 30 µm x 30 µm 2D red color scale

Red blood cells, 30 µm x 30 µm 2D red color scale

Self-assembled lipid nanotubes, 5 µm x 5 µm

Self-assembled lipid nanotubes, 5 µm x 5 µm

Red blood cells 3-D AFM image

Red blood cells 3D AFM image

Polymer used in glue, 2D light shaded view

Polymer used in common glue, 10 µm x 10 µm images, 2-D light shaded view

MFM image of magnetic disk; 40 µm x 40 µm

MFM image of magnetic disk; 40 µm x 40 µm

Polymer used in glue 10 µm x 10 µm 3D color scale

Polymer used in common glue 10 µm x 10 µm image, 3-D color scale view

Inverted Optical microscope image of Caco-2 cells

Inverted Optical microscope image of Caco-2 cells; box indicates area selected for AFM scanning

20 µm X 20 µm AFM image of SHS 100 nm test pattern

20 µm X 20 µm AFM image of SHS 100 nm test pattern, color view

AFM scan of Caco-2 cells; 48 µm x 48 µm.

AFM image of Caco-2 cells; 48 µm x 48 µm. AFM scan of area selected by box in previous inverted optical microscope photo

Inverted optical Image of neutraphil a1 cells

Inverted optical image of neutraphil a1 cells, inverted optical microscope view, AFM probe is shadow

Tip checker sample, 2-D color scale

Tip checker sample, 2-D color scale 20 µm x 20 µm image

Neutrophil & erythrocyte cells; 50 µm light shaded

Neutrophil & erythrocyte cells; 50 µm light shaded

Caco-2 cells. Left: Epiflourescence. Right: AFM

Caco-2 cells. Left: Epiflourescence image of Caco-2 cells treated with quantum dots. Right: 50 µm x 50 µm AFM image of Caco-2 cells

Silicon test pattern 40 µm x 40 µm grey scale image

Silicon test pattern 40 µm x 40 µm grey scale image

Holes in polymer film, 10 µm x 10 µm AFM Image

Holes in polymer film, 10 µm x 10 µm AFM Image

Silicon test pattern, 7 µm x 7 µm zoomed in image

Silicon test pattern, 7 µm x 7 µm zoomed in image of particle viewed in the upper center of the left image.

Multiphase polymer height image

Multiphase polymer height image; 10 µm x 10 µm

Patterns on ferroelectric material 50 µm x 50 µm

Patterns on ferroelectric material 50 µm x 50 µm light shaded image.

Multiphase polymer 10 µm x 10 µm, phase image.

Multiphase polymer 10 µm x 10 µm, phase image.

Light shaded image of cell, 7 µm x 7 µm AFM Image

Light shaded image of cell, 7 µm x 7 µm AFM Image

Vibrating mode showing three species of bacteria

Vibrating mode image showing three different species of bacteria

Bacteria, phase mode image

Bacteria, phase mode image 3 µm x 3 µm image of a single bacteria

Amplitude Image of Leishmania 25 µm x 25 µm

Amplitude Image of Leishmania parasites 25 µm x 25 µm

Scratch mark in metal 10 µm x 10 µm color scale

Scratch mark in a metal surface, 10 µm x 10 µm color scale image

Bacteria spore mutants 30 µm x 30 µm AFM image

Bacteria spore mutants 30 µm x 30 µm AFM image

Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image

Waffle test pattern, 2100 lines per mm, 8 µm x 8 µm color scale image

Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image

Indium Tin Oxide (ITO), 2 µm x 2 µm color scale image

Tobacco Mosaic Virus 1.2 µm x 1.2 µm color scale

Tobacco Mosaic Virus, 1.2 µm x 1.2 µm color scale image of 17 nm diameter single TMV

Conductive AFM scan, standard reference sample

Conductive AFM scan, standard reference sample, 10 µm x 10 µm conductivity image 

Atomic terraces on metal surface, 5 µm x 5 µm

Atomic terraces on metal surface, 5 µm x 5 µm AFM image

0.3 nm terraces on Si, 5 µm x 5 µm color scale image

0.3 nm terraces on Si, 5 µm x 5 µm color scale image

0.3 nm terraces on Si 10 µm x 10 µm error signal image.

0.3 nm terraces on Si 10 µm x 10 µm error signal image. At the bottom right of this image is a 50 nm step.

Gold nanoparticles 2D color scale 14 nm diameter

Gold nanoparticles, 2D color scale 2 µm x 2 µm image of 14 nm diameter particles

Gold nanoparticles 3D color scale 14 nm diameter

Gold nanoparticles, 3-D color scale 2 µm x 2 µm image of 14 nm diameter particles

Phase mode of PMMA 300 nm x 300 nm

Phase mode image of PMMA 300nm x 300nm AFM image

 HOPG, 4 µm x 4 µm

Highly Oriented Pyrolitic Graphite (HOPG), 4 µm x 4 µm

DNA; 1 µm x 1 µm AFM image

DNA; 1 µm x 1 µm AFM image

DNA; 1.5 µm x 1.5 µm

DNA; 1.5 µm x 1.5 µm

DNA 2 µm x 2 µm, on multiple mica layers

DNA 2 µm x 2 µm, on multiple mica layers

DNA; 1.5 µm x 1.5 µm AFM image

DNA; 1.5 µm x 1.5 µm AFM

DVD: 6 µm x 6 µm AFM image

DVD: 6 µm x 6 µm AFM image

6µm x 6µm AFM scan of graphene

AFM scan, Graphene 6µm x 6µm

2µm x 2µm AFM image, Graphene sample

Graphene sample, AFM image 2µm x 2µm

HOPG 2 µm x 2 µm

Highly Oriented Pyrolitic Graphite, HOPG 2 µm x 2 µm, AFM Image

Small scan of microterraces on previous image

STEPP sample: 3 µm x 3 µm, small scan zoom of microterraces observed on the previous 16 µm x 16 µm image

STEPP: smaller scale zoom to view microterraces

STEPP scan: 3 µm x 3 µm, smaller scale zoom to view microterraces seen on previous 16 µm x 16 µm scan

Epithelial Cell 35 µm x 35 µm, 3D AFM image

Epithelial Cell 35 µm x 35 µm, 3D AFM image

STEPP: 16 µm x 16 µm, showing microterraces

STEPP: 16 µm x 16 µm, showing microterraces on terrace, see features in smaller scans 

Cardiomyocytes; inverted optical miroscope image

Cardiomyocytes; inverted optical miroscope image showing location of AFM probe from below

Polystyrene Nanoparticles: Binodal distribution

Polystyrene Nanoparticles: Binodal distribution of nanoparticles, 20 nm and 100 nm

BOPP polymer film; 2 µm x 2 µm.

BOPP Polymer; 2 µm x&nbsp;2 µm biaxially oriented polypropylene (BOPP) film.

Calibration reference - 40 µm x 40 µm x 1 µm

Calibration reference - 40 µm x 40 µm x 1 µm

AFM height image of DNA

DNA AFM height image, 2 µm x 2 µm

E. coli cell, displaying fimbriae & polar flagellum

Single E. coli bacterial cell, displaying fimbriae & polar flagellum

Epithelial cell in liquid, 32 µm x 32 µm AFM image

Epithelial cell in liquid, 32 µm x 32 µm AFM image

Gold Nanoparticles, 100 nm

Gold Nanoparticles, 100 nm

Gold Nanoparticles, 20 nm AFM Image

Gold Nanoparticles, 20 nm AFM Image

Graphene sample, AFM image 11 µm x 11 µm

Graphene sample, AFM image 11 µm x 11 µm

Ruled Grating Irregularities, ruled diffraction grating

Ruled Grating Irregularities, 4 µm x 4 µm ruled diffraction grating, irregularities at edges of the apex on grating lines.

Cardiomyocytes; LS-AFM inverted optical microscope

Cardiomyocytes from the LS-AFM inverted optical microsope

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS Multiple Level Gear, Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

MEMS High Performance Comb-Drive Actuator. Courtesy TX Tech, Sandia Ntl. Labs

Mutant bacteria spores; 30 µm x 30 µm.

Mutant bacteria spores; 30 µm x 30 µm.

Donut shaped particles 2.5 µm x 2.5 µm

Donut shaped nanoparticles, 2.5 µm x 2.5 µm.

Gold nanotriangles

Gold nanotriangles

Patterned wafer after CMP; 50 µm x 50 µm

Structures on patterned wafer after CMP; 50 µm x 50 µm

Polished surface, 3D AFM image; 30 µm x 30 µm

Polished surface, 3D AFM image; 30 µm x 30 µm

Three component polymer phase image; 5µm x 5µm

Three component polymer, AFM phase image; 5µm x 5µm

Oriented polypropylene showing network of fibers

Oriented polypropylene showing network of fibers; 10 µm x 10 µm.

Thermoplastics and rubbers blend. Phase image.

Thermoplastics and rubbers blend. AFM phase image shows differentiation of components in sample; 5 µm x 5 µm.

SEBS polymer; phase image 1 µm x 1 µm.

SEBS polymer (styrene/ethylene/butylene polymer); AFM phase image, 1 µm x 1 µm.

SEBS polymer, AFM topography, 1 µm x 1 µm.

SEBS polymer (styrene/ethylene/butylene polymer); AFM topography image, 1 µm x 1 µm.

SEBS polymer, phase image. 500 nm x 500 nm

SEBS polymer, phase image. 500 nm x 500 nm, smallest domains ~10 nm easily visible

Quantum dots, 3D AFM image, 1.5µm x 1.5 µm

Quantum dots, 3D AFM image, 1.5µm x 1.5 µm

Polymer, AFM phase image; 19 µm x 19 µm.

Polymer, AFM phase image; 19 µm x 19 µm.

Silicon wafer, AFM scan; 10 µm x 10 µm.

Silicon wafer, AFM scan; 10 µm x 10 µm.

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Silicon wafer, 3D AFM scan; 10 µm x 10 µm.

Patterned wafer polished by CMP

Patterned wafer polished by CMP 10 µm x 10 µm on left; square shows area selected for AFM scanning at .5 µm x .5 µm. AFM scan reveals pockmarks on surface.

Patterned wafer polished by CMP, 10 µm x 10 µm

Patterned wafer polished by CMP, 3-D color scale. Analysis revealed surface roughness (Sa) of 1.69 nm

Nanoparticles, 3 µm x 3 µm

Nanoparticles, 3D projection 3 µm x 3 µm image w/nanoparticles from 4 nm to 12 nm in diameter

 

TT-2 AFM Modes

Modes Included with the TT-2 AFM:
The most commonly used modes are included with the TT-2 AFM. A simple drop down selector is used to select and display images in each of the modes.

Non-Vibrating(contact) In Non-Vibrating mode the deflection of the cantilever is held constant as the sample is scanned. This mode is used for hard samples, and fore training purposes.
Vibrating(tapping) A piezoelectric ceramic is used to vibrated the cantilever at resonance. The amplitude of vibration is held constant as the sample is scanned. Both soft and hard samples are scanned with vibrating mode.
Phase While scanning in vibrating mode, and holding the cantilever vibration amplitude constant, the phase shift between the drive signal and photodetecgtor are displayed. The hase image gives a map of the relative hardness at a sample's surface.
Frictional Force With the 4 segmant photodetector in the TT-2 AFM the L-R signal can be captured and displayed while scanning.

AFM cantilever resonance frequency shown in software

With the window below, the resonance frequency of a cantilever is readily measured. Additionally, the phase characteristics of the probe-sample interaction are captured.

 

 

Optional Modes

Optional modes available for the TT-2 are listed below. These modes can be purchase with the microscope or at a later time.

Conductive AFM(C-AFM)

Magnetic Force Microscopy(MFM)

Lithography

Advanced Force Distance

Scanning Thermal Microscopy(SThM)

Scanning Tunneling Microscope(STM)

Dunk n Scan – Open Liquid Cell

Environmental Cell – Closed Liquid Cell

Electric Force Microscopy(EFM)

TT-2 AFM Options

The TT-2 has several options including advanced packages and accessories for various modes of scanning as well as educational packages.

High resolution TT-2 Atomic Force Microscope with acoustic enclosure

Atomic Force Microscope Configuration

TT-2 AFM Advanced Configuration

The TT-2 AFM Advanced Configuration provides all of the advanced features required for demanding projects. The benefit of purchasing this package includes a substantial package discounted price, as well as ensuring that you are ready for any demanding project as soon as your AFM is delivered to your lab.This package includes:

TT-2 AFM

50 Micron Scanner

15 Micron Scanner

Motorized Focus Assist

Advanced Force Distance

Image Logger

Acoustic Cabinet

Break-Out Box

Documentation Package



TT-2 Atomic Force Microscope Advanced Configuration

Additional TT-2 AFM Options

Assembly Workshop Attendees build and learn to operate their TT-2 AFM, along with receiving training on the theory, operation and applications of an atomic force microscope. Learn More
High Resolution Scanner Allows a range of 15 X 15 microns in XY and 7 microns in Z. Learn More
Acoustic Enclosure Reduces unwanted acoustic and structural vibrations.Learn More
Dunk and Scan Probe Holder Open liquid cell for scanning samples submerged in liquids. Can directly replace the TT-2 AFM probe holder of the NP, SA, or LS-AFM probe holder.Learn More
Environmental Cell Permits scanning in inert environments or liquids. Learn More
AFM Laboratory-Based Curriculum All-inclusive curriculum introduces undergraduate students to atomic force microscopy. Includes Student Manual, Teacher Manual, four samples, and eight probes.Learn More
Conductive AFM Measures the 2-D conductivity of sample surfaces.Learn More
Magnetic Force Microscopy Measures the surface magnetic field of a sample by incorporating a magnetic probe into the AFM.Learn More
Lithography Uses an AFM probe to alter the physical or chemical property of a sample surface. Learn More
Advanced Force Distance Curves Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters such as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Learn More
Scanning Tunneling Microscope The current flow between the probe and sample is used to control the feedback loop in the microscope when scanning electrically conductive samples.
Electric Force Microscope Using two pass scanning, the electric charge at a surface is imaged.
Focus Assist A motoriized focus allows precise focus, following the probe during probe approach, and rabidly moving between focus on the sample and focus on the probe.
Breakout Box BNC gives access to most of the signals in the Ebox
Document Package This option included all of the mechanical drawings, electronic schematics, and software protocols used in the microscope.
Image Logger This option allows display of 6 channels in the forward and reverse direction, and it has a spectrum function, as well as a 6 channel data logger.
TT-2 AFM Specifications

Table-Top AFM Specifications

Scanner Specifications

100 X 100 X 17 50 X 50 X 17 15 X 15 X 7
Engineering Specifications
XY Resolution 0.010 nm 0.005 nm 0.003 nm
XY Linearity ,<0.1% <0.1% <0.1%
Z Resolution 0.003 nm 0.003 nm 0.0015 nm
Z Linearity <0.1% <0.1% <0.1%
Performance Specications
XY Range 100 µm 50 µm 15 µm
XY Linearity <1% <1% <1%
XY Resolution
Closed Loop <6 nm <3 nm <1 nm
Open Loop <1 nm < 1 nm <0.3 nm
Z Range 17 µm 17 microns 7 µm
Z Linearity
Open Loop < 5% < 5% < 5%
Closed Loop < 1% < 1% < 1%
Z Sensor Noise 1 nm 1 nm N.A.
Z Feedback Noise <0.15 nm <0.15 nm < 0.08 nm
Actuator Type Piezo Piezo Piezo
Design Modified Tripod Modified Tripod Modified Tripod
XY Sensor Type Strain Gauge Strain Gauge Strain Gauge
Z Sensor Type Strain Gauge Strain Gauge N.A.

Electronic Control Specifications

XY Scan 2 X 28 bits 24 bit Scan DAC, 4 bit gain 192 Khz
XY Linearization Control 2 X 24 bits 24 bit ADC 192 Khz
Z Axis Control Analog 4 amplifier – GPID 1 microvolt noise
Input Signal Bandwith 5 Mhz
Z axis Signal Capture 20 bits 16 bit ADC, 4 bit gain 50 Khz
Phase Signal Capture 2 X 16 bits ADC 50 Khz
L-R Signal Capture 2 X 16 bits ADC 50 Khz
Amplitude Signal Capture 2 X 16 bits ADC 50 Khz
Z error Signal Caputre 2 X 16 bits ADC 50 Khz
Main Controller MPU 80Mz/105DMipts,32 Bits(5-stage pipeline, harvard architecture)
Excitation/Modulation Analog PLL 0-800 Khz
Comunicaition USB 2.0
Signal capture specified includes the image logger option- Without Image Logger 1 X 16 bits

Optional Electronics Specifications

User Input Signal(1) 32 X 18 bits ADC 625 Khz
User Ourpur(1) 32 X 18 bits DAC 625 Khz
User Monitor(1) 48 Lines Digital IO Mhz
Optional Controller MPU(2) 80Mz/105DMipts,32 Bits(5-stage pipeline, harvard architecture)

(1)Optional User I/O upgrade
(2)Used for MFM, PhotoCorrect, EFM

Software

Environment LabVIEW
Operating System Windows
Image Acquisition Real Time Display
(2 of 8 channels)
Control Parameters  
PID Yes
Setpoint Yes
Range Yes
Scan Rate Yes
Image Rotate 0 and 90 degrees
Laser Align Yes
Vibrating Freq. Display Yes
Force Distance Yes
Tip Approach Yes
Oscilloscope Yes
Image Store Format Industry Standard
Image Pixels 16 X 16 to 1024 X 1024
H.V. Gain Control XY and Z
Real time display Line Level, Light Shaded,
Grey Color Pallet
Calibration System Window
Probe Center Yes


Video Microscope

 
Minimum Zoom
Maximum Zoom
 
Field of view
2 x 2 mm
300 x 300 u
 
Resolution
20 µm
2 µm
 
Working Distance
114 mm
114 mm
 
Magnification
45X
400X
 

 

 

* Z Noise performance depends greatly on the environment the TT-2 AFM is used in. Best Z noise performance is obtained in a vibration free environment.

** Every effort is made to present accurate specifications, however, due to circumstances beyond AFMWorkshop's control specifications are subject to change. All specifications are accurate to +/-5%.

TT-2 AFM Product Datasheet PDF

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